Fringe pattern analysis for optical metrology : theory, algorithms, and applications

Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe patte...

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Hlavní autori: Servín, Manuel, Quiroga, J. Antonio, Padilla, J. Moisés
Médium: E-kniha Kniha
Jazyk:English
Vydavateľské údaje: Weinheim Wiley-VCH 2014
Wiley
John Wiley & Sons, Incorporated
Vydanie:1
Predmet:
(BISAC Subject Heading)SCI021000
(Produktform)Hardback
(VLB-Produktgruppen)TN000
(VLB-WN)1643: Hardcover, Softcover / Physik, Astronomie/Elektrizität, Magnetismus, Optik
Data processing
Diffraction patterns
Interferometry
Interferometry > Mathematical models
Messtechnik
Optical measurements
Optical measurements > Mathematical models
Optik
Optische Messtechnik
TECHNOLOGY & ENGINEERING
ISBN:9783527411528, 3527411526, 9783527681105, 3527681108
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Popis
Shrnutí:Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.
Bibliografia:Inludes bibliographical references (p.315-324) and index
ISBN:9783527411528
3527411526
9783527681105
3527681108
DOI:10.1002/9783527681075