Servín, M., Quiroga, J. A., & Padilla, J. M. (2014). Fringe pattern analysis for optical metrology: Theory, algorithms, and applications (1.). Wiley-VCH. https://doi.org/10.1002/9783527681075
Citace podle Chicago (17th ed.)Servín, Manuel, J. Antonio Quiroga, a J. Moisés Padilla. Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications. 1. Weinheim: Wiley-VCH, 2014. https://doi.org/10.1002/9783527681075.
Citace podle MLA (9th ed.)Servín, Manuel, et al. Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications. 1. Wiley-VCH, 2014. https://doi.org/10.1002/9783527681075.
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