Vanmeert, F., De Nolf, W., Dik, J., & Janssens, K. (2018). Macroscopic X-ray Powder Diffraction Scanning: Possibilities for Quantitative and Depth-Selective Parchment Analysis. Analytical chemistry (Washington), 90(11), 6445. https://doi.org/10.1021/acs.analchem.8b00241
Citace podle Chicago (17th ed.)Vanmeert, Frederik, Wout De Nolf, Joris Dik, a Koen Janssens. "Macroscopic X-ray Powder Diffraction Scanning: Possibilities for Quantitative and Depth-Selective Parchment Analysis." Analytical Chemistry (Washington) 90, no. 11 (2018): 6445. https://doi.org/10.1021/acs.analchem.8b00241.
Citace podle MLA (9th ed.)Vanmeert, Frederik, et al. "Macroscopic X-ray Powder Diffraction Scanning: Possibilities for Quantitative and Depth-Selective Parchment Analysis." Analytical Chemistry (Washington), vol. 90, no. 11, 2018, p. 6445, https://doi.org/10.1021/acs.analchem.8b00241.