Strong Plasmon Reflection at Nanometer-Size Gaps in Monolayer Graphene on SiC

We employ tip-enhanced infrared near-field microscopy to study the plasmonic properties of epitaxial quasi-free-standing monolayer graphene on silicon carbide. The near-field images reveal propagating graphene plasmons, as well as a strong plasmon reflection at gaps in the graphene layer, which appe...

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Vydáno v:	Nano letters Ročník 13; číslo 12; s. 6210 - 6215
Hlavní autoři:	Chen, Jianing, Nesterov, Maxim L, Nikitin, Alexey Yu, Thongrattanasiri, Sukosin, Alonso-González, Pablo, Slipchenko, Tetiana M, Speck, Florian, Ostler, Markus, Seyller, Thomas, Crassee, Iris, Koppens, Frank H. L, Martin-Moreno, Luis, García de Abajo, F. Javier, Kuzmenko, Alexey B, Hillenbrand, Rainer
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	Washington, DC American Chemical Society 11.12.2013
Témata:	Carbon Compounds, Inorganic - chemistry Collective excitations (including excitons, polarons, plasmons and other charge-density excitations) Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science; rheology Electromagnetic Fields Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Fullerenes and related materials; diamonds, graphite Graphene Graphite - chemistry Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties Materials science Microscopy Microscopy, Atomic Force Monolayers Nanostructure Nanostructures - chemistry Physics Plasmons Reflection Silicon carbide Silicon Compounds - chemistry Specific materials Surface and interface electron states Surface Plasmon Resonance Surface Properties Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) plasmon reflection SiC Graphene near-field microscopy s-SNOM graphene plasmons Near infrared radiation Nanometer scale Silicon carbide Epitaxial layers Epitaxy Digital simulation Monolayers Plasmons Nanostructures
ISSN:	1530-6984, 1530-6992, 1530-6992
On-line přístup:	Získat plný text
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