Strong Plasmon Reflection at Nanometer-Size Gaps in Monolayer Graphene on SiC
We employ tip-enhanced infrared near-field microscopy to study the plasmonic properties of epitaxial quasi-free-standing monolayer graphene on silicon carbide. The near-field images reveal propagating graphene plasmons, as well as a strong plasmon reflection at gaps in the graphene layer, which appe...
Uloženo v:
| Vydáno v: | Nano letters Ročník 13; číslo 12; s. 6210 - 6215 |
|---|---|
| Hlavní autoři: | , , , , , , , , , , , , , , |
| Médium: | Journal Article |
| Jazyk: | angličtina |
| Vydáno: |
Washington, DC
American Chemical Society
11.12.2013
|
| Témata: | |
| ISSN: | 1530-6984, 1530-6992, 1530-6992 |
| On-line přístup: | Získat plný text |
| Tagy: |
Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
|
| Abstract | We employ tip-enhanced infrared near-field microscopy to study the plasmonic properties of epitaxial quasi-free-standing monolayer graphene on silicon carbide. The near-field images reveal propagating graphene plasmons, as well as a strong plasmon reflection at gaps in the graphene layer, which appear at the steps between the SiC terraces. When the step height is around 1.5 nm, which is two orders of magnitude smaller than the plasmon wavelength, the reflection signal reaches 20% of its value at graphene edges, and it approaches 50% for step heights as small as 5 nm. This intriguing observation is corroborated by numerical simulations and explained by the accumulation of a line charge at the graphene termination. The associated electromagnetic fields at the graphene termination decay within a few nanometers, thus preventing efficient plasmon transmission across nanoscale gaps. Our work suggests that plasmon propagation in graphene-based circuits can be tailored using extremely compact nanostructures, such as ultranarrow gaps. It also demonstrates that tip-enhanced near-field microscopy is a powerful contactless tool to examine nanoscale defects in graphene. |
|---|---|
| AbstractList | We employ tip-enhanced infrared near-field microscopy to study the plasmonic properties of epitaxial quasi-free-standing monolayer graphene on silicon carbide. The near-field images reveal propagating graphene plasmons, as well as a strong plasmon reflection at gaps in the graphene layer, which appear at the steps between the SiC terraces. When the step height is around 1.5 nm, which is two orders of magnitude smaller than the plasmon wavelength, the reflection signal reaches 20% of its value at graphene edges, and it approaches 50% for step heights as small as 5 nm. This intriguing observation is corroborated by numerical simulations and explained by the accumulation of a line charge at the graphene termination. The associated electromagnetic fields at the graphene termination decay within a few nanometers, thus preventing efficient plasmon transmission across nanoscale gaps. Our work suggests that plasmon propagation in graphene-based circuits can be tailored using extremely compact nanostructures, such as ultranarrow gaps. It also demonstrates that tip-enhanced near-field microscopy is a powerful contactless tool to examine nanoscale defects in graphene. We employ tip-enhanced infrared near-field microscopy to study the plasmonic properties of epitaxial quasi-free-standing monolayer graphene on silicon carbide. The near-field images reveal propagating graphene plasmons, as well as a strong plasmon reflection at gaps in the graphene layer, which appear at the steps between the SiC terraces. When the step height is around 1.5 nm, which is two orders of magnitude smaller than the plasmon wavelength, the reflection signal reaches 20% of its value at graphene edges, and it approaches 50% for step heights as small as 5 nm. This intriguing observation is corroborated by numerical simulations and explained by the accumulation of a line charge at the graphene termination. The associated electromagnetic fields at the graphene termination decay within a few nanometers, thus preventing efficient plasmon transmission across nanoscale gaps. Our work suggests that plasmon propagation in graphene-based circuits can be tailored using extremely compact nanostructures, such as ultranarrow gaps. It also demonstrates that tip-enhanced near-field microscopy is a powerful contactless tool to examine nanoscale defects in graphene.We employ tip-enhanced infrared near-field microscopy to study the plasmonic properties of epitaxial quasi-free-standing monolayer graphene on silicon carbide. The near-field images reveal propagating graphene plasmons, as well as a strong plasmon reflection at gaps in the graphene layer, which appear at the steps between the SiC terraces. When the step height is around 1.5 nm, which is two orders of magnitude smaller than the plasmon wavelength, the reflection signal reaches 20% of its value at graphene edges, and it approaches 50% for step heights as small as 5 nm. This intriguing observation is corroborated by numerical simulations and explained by the accumulation of a line charge at the graphene termination. The associated electromagnetic fields at the graphene termination decay within a few nanometers, thus preventing efficient plasmon transmission across nanoscale gaps. Our work suggests that plasmon propagation in graphene-based circuits can be tailored using extremely compact nanostructures, such as ultranarrow gaps. It also demonstrates that tip-enhanced near-field microscopy is a powerful contactless tool to examine nanoscale defects in graphene. |
| Author | Thongrattanasiri, Sukosin Speck, Florian Crassee, Iris Hillenbrand, Rainer Alonso-González, Pablo Ostler, Markus Nikitin, Alexey Yu Koppens, Frank H. L Slipchenko, Tetiana M García de Abajo, F. Javier Kuzmenko, Alexey B Chen, Jianing Martin-Moreno, Luis Nesterov, Maxim L Seyller, Thomas |
| AuthorAffiliation | IKERBASQUE Basque Foundation for Science ICREA-Institució Catalana de Recerca i Estudis Avançats Institut für Physik - Technische Physik Technische Universität Chemnitz Department of Physics ICFO-Institut de Ciéncies Fotoniques Department Physik Université de Geneve Kasetsart University Universität Erlangen-Nürnberg CSIC-Universidad de Zaragoza Instituto de Ciencia de Materiales de Aragón and Departamento de Física de la Materia Condensada Département de Physique de la Matière Condensée |
| AuthorAffiliation_xml | – name: Département de Physique de la Matière Condensée – name: Institut für Physik - Technische Physik – name: Technische Universität Chemnitz – name: Department of Physics – name: ICFO-Institut de Ciéncies Fotoniques – name: CSIC-Universidad de Zaragoza – name: IKERBASQUE Basque Foundation for Science – name: Department Physik – name: Universität Erlangen-Nürnberg – name: Instituto de Ciencia de Materiales de Aragón and Departamento de Física de la Materia Condensada – name: Kasetsart University – name: ICREA-Institució Catalana de Recerca i Estudis Avançats – name: Université de Geneve |
| Author_xml | – sequence: 1 givenname: Jianing surname: Chen fullname: Chen, Jianing – sequence: 2 givenname: Maxim L surname: Nesterov fullname: Nesterov, Maxim L – sequence: 3 givenname: Alexey Yu surname: Nikitin fullname: Nikitin, Alexey Yu – sequence: 4 givenname: Sukosin surname: Thongrattanasiri fullname: Thongrattanasiri, Sukosin – sequence: 5 givenname: Pablo surname: Alonso-González fullname: Alonso-González, Pablo – sequence: 6 givenname: Tetiana M surname: Slipchenko fullname: Slipchenko, Tetiana M – sequence: 7 givenname: Florian surname: Speck fullname: Speck, Florian – sequence: 8 givenname: Markus surname: Ostler fullname: Ostler, Markus – sequence: 9 givenname: Thomas surname: Seyller fullname: Seyller, Thomas – sequence: 10 givenname: Iris surname: Crassee fullname: Crassee, Iris – sequence: 11 givenname: Frank H. L surname: Koppens fullname: Koppens, Frank H. L – sequence: 12 givenname: Luis surname: Martin-Moreno fullname: Martin-Moreno, Luis – sequence: 13 givenname: F. Javier surname: García de Abajo fullname: García de Abajo, F. Javier – sequence: 14 givenname: Alexey B surname: Kuzmenko fullname: Kuzmenko, Alexey B – sequence: 15 givenname: Rainer surname: Hillenbrand fullname: Hillenbrand, Rainer email: r.hillenbrand@nanogune.eu |
| BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=28067436$$DView record in Pascal Francis https://www.ncbi.nlm.nih.gov/pubmed/24188400$$D View this record in MEDLINE/PubMed |
| BookMark | eNqF0U1P3DAQBmCroipfPfAHqlwqlUOK7The51it2gWJL7H0bM06Y2rk2Fvbe6C_nkQsICGknjyHZ96xZvbJTogBCTli9DujnJ0EL2gjOS8fyB5rG1rLruM7L7USu2Q_53tKade09BPZ5YIpJSjdIxfLkmK4q6495CGG6gatR1PcWEKpLiHEAQumeun-YbWAda5cqC5iiB4eMFWLBOs_GLAa_dLND8lHCz7j5-17QH7_-nk7P63PrxZn8x_nNQghSm05F30vRUOhAxS8FSsmmGVWmcashOokRSUlXRnFOmkRpGxb7KTifSuF7ZsD8u0pd53i3w3mogeXDXoPAeMmazZrmylmJv9PxaQUn3Uj_bKlm9WAvV4nN0B60M_bGsHXLYBswNsEwbj86hSVM9FMM0-enEkx54RWG1dgWmpJ4LxmVE930y93GzuO33Q8h75nt78Ak_V93KQwrvod9wiKLaEW |
| CitedBy_id | crossref_primary_10_1038_s41567_021_01327_8 crossref_primary_10_1088_1674_1056_ab46a2 crossref_primary_10_1038_srep28799 crossref_primary_10_1016_j_compstruct_2020_112978 crossref_primary_10_1038_srep09837 crossref_primary_10_1088_1674_1056_26_7_074220 crossref_primary_10_1063_5_0081395 crossref_primary_10_1088_2053_1583_ab0051 crossref_primary_10_1007_s00340_014_5954_3 crossref_primary_10_1515_nanoph_2020_0449 crossref_primary_10_1016_j_aca_2018_05_046 crossref_primary_10_1002_adom_201800537 crossref_primary_10_1002_adts_201900033 crossref_primary_10_1038_ncomms4499 crossref_primary_10_1038_s41467_022_28786_8 crossref_primary_10_1080_23746149_2019_1593051 crossref_primary_10_1515_nanoph_2022_0774 crossref_primary_10_1002_nadc_201490262 crossref_primary_10_1016_j_apmt_2018_06_009 crossref_primary_10_1038_s41467_022_28614_z crossref_primary_10_1039_C7CP05923J crossref_primary_10_1364_JOSAB_33_001303 crossref_primary_10_1364_JOSAB_36_001189 crossref_primary_10_1088_0957_4484_27_3_035205 crossref_primary_10_1088_2040_8978_17_1_015002 crossref_primary_10_1002_adma_201701083 crossref_primary_10_1002_adom_202102723 crossref_primary_10_1016_j_carbon_2014_03_016 crossref_primary_10_1146_annurev_anchem_071114_040435 crossref_primary_10_1002_adma_201702494 crossref_primary_10_1038_nmat4169 crossref_primary_10_1016_j_carbon_2015_05_025 crossref_primary_10_1088_2043_6254_aa92bd crossref_primary_10_1002_adfm_202105763 crossref_primary_10_1007_s12274_022_5297_z crossref_primary_10_1038_ncomms7407 crossref_primary_10_1126_science_aag1992 crossref_primary_10_1109_ACCESS_2014_2364091 crossref_primary_10_1364_AO_56_000870 crossref_primary_10_1002_adma_202008070 crossref_primary_10_1038_lsa_2017_57 crossref_primary_10_1038_lsa_2016_204 crossref_primary_10_1038_nphoton_2017_98 crossref_primary_10_1039_C6CS00195E crossref_primary_10_1063_5_0189724 |
| Cites_doi | 10.1021/nl300572y 10.1063/1.2891452 10.4028/www.scientific.net/MSF.645-648.629 10.1038/nnano.2009.474 10.1103/PhysRevB.84.195446 10.1038/nmat2382 10.1126/science.1171245 10.1038/nphoton.2012.262 10.1103/PhysRevLett.108.246104 10.1088/1367-2630/8/12/318 10.1103/PhysRevB.88.085408 10.1103/PhysRevB.80.245435 10.1021/nn400342v 10.1126/science.1202691 10.1063/1.2348781 10.1021/nl201771h 10.1098/rsta.2003.1347 10.1038/nnano.2010.132 10.1038/nature11254 10.1103/PhysRevLett.97.266406 10.1038/NNANO. 2013.197. 10.1063/1.3643034 10.1126/science.1125925 10.1103/PhysRevB.75.205418 10.1140/epjb/e2007-00142-3 10.1021/nl2019855 10.1038/nature11253 10.1103/PhysRevLett.103.246804 |
| ContentType | Journal Article |
| Copyright | Copyright © 2013 American Chemical
Society 2015 INIST-CNRS |
| Copyright_xml | – notice: Copyright © 2013 American Chemical Society – notice: 2015 INIST-CNRS |
| DBID | AAYXX CITATION IQODW CGR CUY CVF ECM EIF NPM 7X8 7SR 7U5 8BQ 8FD JG9 L7M |
| DOI | 10.1021/nl403622t |
| DatabaseName | CrossRef Pascal-Francis Medline MEDLINE MEDLINE (Ovid) MEDLINE MEDLINE PubMed MEDLINE - Academic Engineered Materials Abstracts Solid State and Superconductivity Abstracts METADEX Technology Research Database Materials Research Database Advanced Technologies Database with Aerospace |
| DatabaseTitle | CrossRef MEDLINE Medline Complete MEDLINE with Full Text PubMed MEDLINE (Ovid) MEDLINE - Academic Materials Research Database Engineered Materials Abstracts Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace METADEX |
| DatabaseTitleList | MEDLINE - Academic Materials Research Database MEDLINE |
| Database_xml | – sequence: 1 dbid: NPM name: PubMed url: http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed sourceTypes: Index Database – sequence: 2 dbid: 7X8 name: MEDLINE - Academic url: https://search.proquest.com/medline sourceTypes: Aggregation Database |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering Physics |
| EISSN | 1530-6992 |
| EndPage | 6215 |
| ExternalDocumentID | 24188400 28067436 10_1021_nl403622t a07707082 |
| Genre | Research Support, Non-U.S. Gov't Journal Article |
| GroupedDBID | - .K2 123 4.4 55A 5VS 7~N AABXI ABMVS ABPTK ABUCX ACGFS ACS AEESW AENEX AFEFF ALMA_UNASSIGNED_HOLDINGS AQSVZ BAANH CS3 DU5 EBS ED ED~ EJD F5P GNL IH9 IHE JG JG~ K2 LG6 PK8 RNS ROL TN5 UI2 VF5 VG9 W1F X --- -~X 6P2 AAHBH AAYXX ABBLG ABJNI ABLBI ABQRX ACBEA ADHLV AHGAQ CITATION CUPRZ GGK 53G AAYOK AFFNX IQODW CGR CUY CVF ECM EIF NPM 7X8 7SR 7U5 8BQ 8FD JG9 L7M |
| ID | FETCH-LOGICAL-a444t-f224dd6430a9ae4254b141f1f8c3cb48960e8660bc8196fea6655e9682d564fd3 |
| IEDL.DBID | ACS |
| ISICitedReferencesCount | 77 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000328439200069&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| ISSN | 1530-6984 1530-6992 |
| IngestDate | Fri Jul 11 12:12:40 EDT 2025 Thu Jul 10 18:38:21 EDT 2025 Thu Apr 03 06:59:28 EDT 2025 Wed Apr 02 07:15:09 EDT 2025 Sat Nov 29 01:49:19 EST 2025 Tue Nov 18 21:20:52 EST 2025 Thu Aug 27 13:41:53 EDT 2020 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 12 |
| Keywords | plasmon reflection SiC Graphene near-field microscopy s-SNOM graphene plasmons Near infrared radiation Nanometer scale Silicon carbide Epitaxial layers Epitaxy Digital simulation Monolayers Plasmons Nanostructures |
| Language | English |
| License | CC BY 4.0 |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-a444t-f224dd6430a9ae4254b141f1f8c3cb48960e8660bc8196fea6655e9682d564fd3 |
| Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
| PMID | 24188400 |
| PQID | 1467638279 |
| PQPubID | 23479 |
| PageCount | 6 |
| ParticipantIDs | proquest_miscellaneous_1753489676 proquest_miscellaneous_1467638279 pubmed_primary_24188400 pascalfrancis_primary_28067436 crossref_citationtrail_10_1021_nl403622t crossref_primary_10_1021_nl403622t acs_journals_10_1021_nl403622t |
| ProviderPackageCode | JG~ 55A AABXI GNL VF5 7~N VG9 W1F ACS AEESW AFEFF .K2 ABMVS ABUCX IH9 BAANH AQSVZ ED~ UI2 |
| PublicationCentury | 2000 |
| PublicationDate | 2013-12-11 |
| PublicationDateYYYYMMDD | 2013-12-11 |
| PublicationDate_xml | – month: 12 year: 2013 text: 2013-12-11 day: 11 |
| PublicationDecade | 2010 |
| PublicationPlace | Washington, DC |
| PublicationPlace_xml | – name: Washington, DC – name: United States |
| PublicationTitle | Nano letters |
| PublicationTitleAlternate | Nano Lett |
| PublicationYear | 2013 |
| Publisher | American Chemical Society |
| Publisher_xml | – name: American Chemical Society |
| References | Garcia-Pomar J. L. (ref17/cit17) 2013; 7 Berger C. (ref13/cit13) 2006; 312 Emtsev K. V. (ref14/cit14) 2009; 8 ref18/cit18 Bae S. (ref12/cit12) 2010; 5 Ji S. H. (ref30/cit30) 2011; 11 Vakil A. (ref7/cit7) 2011; 332 Riedl C. (ref15/cit15) 2009; 103 Nikitin A. Y. (ref6/cit6) 2011; 84 Hanson G. W. (ref1/cit1) 2008; 103 Koppens F. H. L. (ref5/cit5) 2011; 11 Chen J. N. (ref8/cit8) 2012; 487 Keilmann F. (ref23/cit23) 2004; 362 Hwang E. H. (ref27/cit27) 2007; 75 Ocelic N. (ref24/cit24) 2006; 89 Speck F. (ref20/cit20) 2011; 99 Fei Z. (ref9/cit9) 2012; 487 Grigorenko A. N. (ref10/cit10) 2012; 6 Speck F. (ref19/cit19) 2010; 645 Li X. S. (ref11/cit11) 2009; 324 Tzalenchuk A. (ref16/cit16) 2010; 5 Wunsch B. (ref3/cit3) 2006; 8 Jablan M. (ref4/cit4) 2009; 80 Falkovsky L. A. (ref26/cit26) 2007; 56 Robinson J. A. (ref29/cit29) 2011; 11 Crassee I. (ref22/cit22) 2012; 12 Vafek O. (ref2/cit2) 2006; 97 Ostler M. (ref25/cit25) 2013; 88 Ristein J. (ref21/cit21) 2012; 108 Wunsch B. (ref28/cit28) 2006; 8 |
| References_xml | – volume: 12 start-page: 2470 year: 2012 ident: ref22/cit22 publication-title: Nano Lett. doi: 10.1021/nl300572y – volume: 103 year: 2008 ident: ref1/cit1 publication-title: J. Appl. Phys. doi: 10.1063/1.2891452 – volume: 11 start-page: 114 year: 2011 ident: ref30/cit30 publication-title: Nat. Mater. – volume: 645 start-page: 629 year: 2010 ident: ref19/cit19 publication-title: Mater. Sci. Forum doi: 10.4028/www.scientific.net/MSF.645-648.629 – volume: 5 start-page: 186 year: 2010 ident: ref16/cit16 publication-title: Nat. Nanotechnol. doi: 10.1038/nnano.2009.474 – volume: 84 start-page: 195446 year: 2011 ident: ref6/cit6 publication-title: Phys. Rev. B doi: 10.1103/PhysRevB.84.195446 – volume: 8 start-page: 203 year: 2009 ident: ref14/cit14 publication-title: Nat. Mater. doi: 10.1038/nmat2382 – volume: 324 start-page: 1312 year: 2009 ident: ref11/cit11 publication-title: Science doi: 10.1126/science.1171245 – volume: 6 start-page: 749 year: 2012 ident: ref10/cit10 publication-title: Nat. Photonics doi: 10.1038/nphoton.2012.262 – volume: 108 start-page: 246104 year: 2012 ident: ref21/cit21 publication-title: Phys. Rev. Lett. doi: 10.1103/PhysRevLett.108.246104 – volume: 8 start-page: 318 year: 2006 ident: ref3/cit3 publication-title: New J. Phys. doi: 10.1088/1367-2630/8/12/318 – volume: 88 start-page: 085408 year: 2013 ident: ref25/cit25 publication-title: Phys. Rev. B doi: 10.1103/PhysRevB.88.085408 – volume: 80 start-page: 245435 year: 2009 ident: ref4/cit4 publication-title: Phys. Rev. B doi: 10.1103/PhysRevB.80.245435 – volume: 7 start-page: 4988 year: 2013 ident: ref17/cit17 publication-title: ACS Nano doi: 10.1021/nn400342v – volume: 332 start-page: 1291 year: 2011 ident: ref7/cit7 publication-title: Science doi: 10.1126/science.1202691 – volume: 89 start-page: 101124 year: 2006 ident: ref24/cit24 publication-title: Appl. Phys. Lett. doi: 10.1063/1.2348781 – volume: 11 start-page: 3370 year: 2011 ident: ref5/cit5 publication-title: Nano Lett. doi: 10.1021/nl201771h – volume: 362 start-page: 787 year: 2004 ident: ref23/cit23 publication-title: Philos. Trans. R. Soc. London, Ser. A doi: 10.1098/rsta.2003.1347 – volume: 5 start-page: 574 year: 2010 ident: ref12/cit12 publication-title: Nat. Nanotechnol. doi: 10.1038/nnano.2010.132 – volume: 487 start-page: 77 year: 2012 ident: ref8/cit8 publication-title: Nature doi: 10.1038/nature11254 – volume: 97 start-page: 266406 year: 2006 ident: ref2/cit2 publication-title: Phys. Rev. Lett. doi: 10.1103/PhysRevLett.97.266406 – volume: 8 start-page: 318 year: 2006 ident: ref28/cit28 publication-title: New J. Phys. doi: 10.1088/1367-2630/8/12/318 – ident: ref18/cit18 doi: 10.1038/NNANO. 2013.197. – volume: 99 start-page: 112016 year: 2011 ident: ref20/cit20 publication-title: Appl. Phys. Lett. doi: 10.1063/1.3643034 – volume: 312 start-page: 1191 year: 2006 ident: ref13/cit13 publication-title: Science doi: 10.1126/science.1125925 – volume: 75 start-page: 205418 year: 2007 ident: ref27/cit27 publication-title: Phys. Rev. B doi: 10.1103/PhysRevB.75.205418 – volume: 56 start-page: 281 year: 2007 ident: ref26/cit26 publication-title: Eur. Phys. J. B doi: 10.1140/epjb/e2007-00142-3 – volume: 11 start-page: 3875 year: 2011 ident: ref29/cit29 publication-title: Nano Lett. doi: 10.1021/nl2019855 – volume: 487 start-page: 82 year: 2012 ident: ref9/cit9 publication-title: Nature doi: 10.1038/nature11253 – volume: 103 start-page: 246804 year: 2009 ident: ref15/cit15 publication-title: Phys. Rev. Lett. doi: 10.1103/PhysRevLett.103.246804 |
| SSID | ssj0009350 |
| Score | 2.4322915 |
| Snippet | We employ tip-enhanced infrared near-field microscopy to study the plasmonic properties of epitaxial quasi-free-standing monolayer graphene on silicon carbide.... |
| SourceID | proquest pubmed pascalfrancis crossref acs |
| SourceType | Aggregation Database Index Database Enrichment Source Publisher |
| StartPage | 6210 |
| SubjectTerms | Carbon Compounds, Inorganic - chemistry Collective excitations (including excitons, polarons, plasmons and other charge-density excitations) Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science; rheology Electromagnetic Fields Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Fullerenes and related materials; diamonds, graphite Graphene Graphite - chemistry Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties Materials science Microscopy Microscopy, Atomic Force Monolayers Nanostructure Nanostructures - chemistry Physics Plasmons Reflection Silicon carbide Silicon Compounds - chemistry Specific materials Surface and interface electron states Surface Plasmon Resonance Surface Properties Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) |
| Title | Strong Plasmon Reflection at Nanometer-Size Gaps in Monolayer Graphene on SiC |
| URI | http://dx.doi.org/10.1021/nl403622t https://www.ncbi.nlm.nih.gov/pubmed/24188400 https://www.proquest.com/docview/1467638279 https://www.proquest.com/docview/1753489676 |
| Volume | 13 |
| WOSCitedRecordID | wos000328439200069&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVABC databaseName: ACS customDbUrl: eissn: 1530-6992 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0009350 issn: 1530-6984 databaseCode: ACS dateStart: 20010101 isFulltext: true titleUrlDefault: https://pubs.acs.org/action/showPublications?display=journals providerName: American Chemical Society |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3JTsMwEB2xHUCIfSlLZZYDl4jacRznWFUULqCKgtRbZCc2qlTSigQOfD3jdKNSWe6TJhnPeN7rOG8ALrnyVao1w0Ryn-QIFXkKObZnhRFWR07PICmHTYQPD7LTiVoLcPFDB5_R66zH3S7LikVYZghv3bm9eqM9Vdb1yzGsmLnIgyLJx_JB3y91pSfJZ0rP-kDl6AU7HF_xM74s60xz819PuAUbIxhJ6sN134YFk-3A2jdxwV24b7t_uV9IC_Exxhp5NLZXnrvKiCoI7qr9V3cUxmt3Pw25VYOcdDOCKY5cF2E4uXVK1rgRErRvdxt78Ny8eWrceaPhCZ7inBeexdqcpog3ak5_GzOTa8qppVYmfqK5ROZipBA1nSAmENYoIYLAREKyNBDcpv4-LGX9zBwC0boWGc1tQE3INfITE_oqkFFosLbRhFegit6NR8Gfx2Vfm9F44pcKXI0dHycj6XE3AaM3z_R8YjoY6m3MM6rOrN7E0rWJERKJCpyNlzPGdHE9EJWZ_nvumA7uqJKF0S82SOGcg0L8nYNhLEzvwKlETlw7-uudj2GVuckZlHmUnsBS8fZuTmEl-Si6-VsVFsOOrJaB_AU1U-hM |
| linkProvider | American Chemical Society |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LT8MwDLZ4SYAQ78d4jIA4cKlY2jRNj9PES8CEGEjcqqRN0KTRTWvhwK_H6boNpAHi7qapY8f-6uQzwAmTnkyUctGR7JUcLkNHIsZ2DNfcqNDyGcRFs4mg2RTPz-F9SZNj78LgJDIcKSuK-GN2AXqWdpjdbN18GmZ9DKu2W0G90RoT7HpFN1Z0YIRDoWBDFqGvj9oIFGffItBST2aoDDPoYvFzmlmEm4uV_0x0FZbLpJLUB1awBlM6XYfFL1SDG3DXsv-8X8g9ZstoeeRBm05xCislMie4x3Zf7cEYp9X-0ORS9jLSTgk6PCJfTMrJpeW1xm2RoHyr3diEp4vzx8aVU7ZScCRjLHcMRuokweyjZtm40U-ZoowaakTsxYoJxDFacF5TMWYI3GjJue_rkAs38TkzibcFM2k31TtAlKqFWjHjUx0whWhFB570RRhojHQ0ZhWoolqi0hWyqKhyuzQa6aUCp0P9R3FJRG77YXQmiR6PRHsD9o1JQtVviziStEVjTJB4BY6Gqxqh89iKiEx19y2zuAf3V-EG4S8yCOisggIcZ3tgEuM3MCoQIdd2__rmQ5i_ery7jW6vmzd7sODanhrUdSjdh5m8_6YPYC5-z9tZv1pY9SdXZu_K |
| linkToPdf | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3dT9swED_xMSGmaWx8rdvoPMQDLxF14jjOI-ooQ0BVrSDxFtmJjSqVtGrCHvjruUvTAhIf4v3iOOc73_1y9u8A9oQOdGaMj45EV3Kkjj2NGNtz0kpnYuIzSKtmE1G3q66u4l4NFOkuDE6iwJGKqohPXj3OXM0wwA_yoaAN1y8XYTnEQE4dCw7b_QeS3aDqyIpOjJAoVmLGJPT4UYpCafEkCn0a6wIV4qadLF5ONauQ01l772S_wOc6uWSHU2v4Cgs2X4ePjygHN-C8T_--r1kPs2a0QPbPumF1GitnumS4145u6ICM1x_cWXasxwUb5AwdHxEwJufsmPitcXtkKN8ftDfhsnN00f7r1S0VPC2EKD2HETvLMAtpESs3-qswXHDHnUqD1AiFeMYqKVsmxUxBOqulDEMbS-VnqHCXBVuwlI9y-w2YMa3YGuFCbiNhELXYKNChiiOLEY-nogFNVE1Su0SRVNVunydzvTRgf7YGSVoTklNfjOFzortz0fGUheM5oeaThZxLUvEYEyXZgN-zlU3QiagyonM7ui0I_-A-q_wofkUGgR0pKMJxtqdm8fAGwRUi5db3t775F6z0_nSSs5Pu6Q9Y9am1Bvc9zn_CUjm5tTvwIf1fDopJszLsezG48kQ |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Strong+Plasmon+Reflection+at+Nanometer-Size+Gaps+in+Monolayer+Graphene+on+SiC&rft.jtitle=Nano+letters&rft.au=Chen%2C+Jianing&rft.au=Nesterov%2C+Maxim+L&rft.au=Nikitin%2C+Alexey+Yu&rft.au=Thongrattanasiri%2C+Sukosin&rft.date=2013-12-11&rft.issn=1530-6984&rft.eissn=1530-6992&rft.volume=13&rft.issue=12&rft.spage=6210&rft.epage=6215-6210-6215&rft_id=info:doi/10.1021%2Fnl403622t&rft.externalDBID=NO_FULL_TEXT |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1530-6984&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1530-6984&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1530-6984&client=summon |