Ortolano, G., Visalli, R., Godard, G., & Cirrincione, R. (2018). Quantitative X-ray Map Analyser (Q-XRMA): A new GIS-based statistical approach to Mineral Image Analysis. Computers & geosciences, 115, 56-65. https://doi.org/10.1016/j.cageo.2018.03.001
Chicago-Zitierstil (17. Ausg.)Ortolano, Gaetano, Roberto Visalli, Gaston Godard, und Rosolino Cirrincione. "Quantitative X-ray Map Analyser (Q-XRMA): A New GIS-based Statistical Approach to Mineral Image Analysis." Computers & Geosciences 115 (2018): 56-65. https://doi.org/10.1016/j.cageo.2018.03.001.
MLA-Zitierstil (9. Ausg.)Ortolano, Gaetano, et al. "Quantitative X-ray Map Analyser (Q-XRMA): A New GIS-based Statistical Approach to Mineral Image Analysis." Computers & Geosciences, vol. 115, 2018, pp. 56-65, https://doi.org/10.1016/j.cageo.2018.03.001.