Two Algorithms for Excited-State Quantum Solvers: Theory and Application to EOM-UCCSD
Near-term quantum devices promise to revolutionize quantum chemistry, but simulations using the current noisy intermediate-scale quantum (NISQ) devices are not practical due to their high susceptibility to errors. This motivated the design of NISQ algorithms leveraging classical and quantum resource...
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| Veröffentlicht in: | The journal of physical chemistry. A, Molecules, spectroscopy, kinetics, environment, & general theory Jg. 127; H. 31; S. 6552 |
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| Hauptverfasser: | , |
| Format: | Journal Article |
| Sprache: | Englisch |
| Veröffentlicht: |
United States
10.08.2023
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| ISSN: | 1520-5215, 1520-5215 |
| Online-Zugang: | Weitere Angaben |
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| Zusammenfassung: | Near-term quantum devices promise to revolutionize quantum chemistry, but simulations using the current noisy intermediate-scale quantum (NISQ) devices are not practical due to their high susceptibility to errors. This motivated the design of NISQ algorithms leveraging classical and quantum resources. While several developments have shown promising results for ground-state simulations, extending the algorithms to excited states remains challenging. This paper presents two cost-efficient excited-state algorithms inspired by the classical Davidson algorithm. We implemented the Davidson method into the quantum self-consistent equation-of-motion unitary coupled-cluster (q-sc-EOM-UCC) excited-state method adapted for quantum hardware. The circuit strategies for generating desired excited states are discussed, implemented, and tested. We demonstrate the performance and accuracy of the proposed algorithms (q-sc-EOM-UCC/Davidson and its variational variant) by simulations of H
, H
, LiH, and H
O molecules. Similar to the classical Davidson scheme, q-sc-EOM-UCC/Davidson algorithms are capable of targeting a small number of excited states of the desired character. |
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| Bibliographie: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
| ISSN: | 1520-5215 1520-5215 |
| DOI: | 10.1021/acs.jpca.3c02480 |