APA (7th ed.) Citation

Yu, Y., Jones, J., & Harrold, M. (2008). An empirical study of the effects of test-suite reduction on fault localization. 2008 ACM/IEEE 30th International Conference on Software Engineering, 2008(24), 201-210. https://doi.org/10.1145/1368088.1368116

Chicago Style (17th ed.) Citation

Yu, Yanbing, J.A Jones, and M.J Harrold. "An Empirical Study of the Effects of Test-suite Reduction on Fault Localization." 2008 ACM/IEEE 30th International Conference on Software Engineering 2008, no. 24 (2008): 201-210. https://doi.org/10.1145/1368088.1368116.

MLA (9th ed.) Citation

Yu, Yanbing, et al. "An Empirical Study of the Effects of Test-suite Reduction on Fault Localization." 2008 ACM/IEEE 30th International Conference on Software Engineering, vol. 2008, no. 24, 2008, pp. 201-210, https://doi.org/10.1145/1368088.1368116.