Critical path analysis using a dynamically bounded delay model

This paper focuses on static timing analysis in the presence of capacitive coupling. We propose a novel gate delay model, the dynamically bounded delay model. In contrast to the min-max or bounded delay model which assumes a fixed delay range, [dmin, dmax], for each circuit component, our new model...

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Bibliographic Details
Published in:37th Design Automation Conference, 2000 pp. 260 - 265
Main Author: Hassoun, Soha
Format: Conference Proceeding
Language:English
Published: New York, NY, USA ACM 01.01.2000
IEEE
Series:ACM Conferences
Subjects:
ISBN:9781581131871, 1581131879
Online Access:Get full text
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Summary:This paper focuses on static timing analysis in the presence of capacitive coupling. We propose a novel gate delay model, the dynamically bounded delay model. In contrast to the min-max or bounded delay model which assumes a fixed delay range, [dmin, dmax], for each circuit component, our new model allows for the specification of delay variations and the conditions upon which the variations will hold. Novel static timing analysis algorithms can thus dynamically bound the delays. To demonstrate the effectiveness of this model and approach, we use our model to perform critical path analysis in the presence of capacitive coupling. Our experiments show that our approach avoids pessimism when compared to PERT analysis assuming worst case capacitive coupling.
Bibliography:SourceType-Conference Papers & Proceedings-1
ObjectType-Conference Paper-1
content type line 25
ISBN:9781581131871
1581131879
DOI:10.1145/337292.337413