Post-routing redundant via insertion for yield/reliability improvement

Reducing the yield loss due to via failure is one of the important problems in design for manufacturability. A well known and highly recommended method to improve via yield/reliability is to add redundant vias. In this paper we study the problem of post-routing redundant via insertion and formulate...

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Vydané v:	Proceedings of the 2006 Asia and South Pacific Design Automation Conference s. 303 - 308
Hlavní autori:	Lee, Kuang-Yao, Wang, Ting-Chi
Médium:	Konferenčný príspevok..
Jazyk:	English
Vydavateľské údaje:	Piscataway, NJ, USA IEEE Press 01.01.2006
Edícia:	ACM Conferences
Predmet:	Computing methodologies > Artificial intelligence > Search methodologies > Heuristic function construction Hardware Hardware > Electronic design automation > Physical design (EDA) > Partitioning and floorplanning Hardware > Electronic design automation > Physical design (EDA) > Placement Hardware > Electronic design automation > Physical design (EDA) > Wire routing Hardware > Hardware validation Mathematics of computing > Discrete mathematics > Graph theory > Paths and connectivity problems
ISBN:	9780780394513, 0780394518
On-line prístup:	Získať plný text
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