Low-Cost 7T-SRAM Compute-In-Memory Design based on Bit-Line Charge-Sharing based Analog-To-Digital Conversion

Although compute-in-memory (CIM) is considered as one of the promising solutions to overcome memory wall problem, the variations in analog voltage computation and analog-to-digital-converter (ADC) cost still remain as design challenges. In this paper, we present a 7T SRAM CIM that seamlessly support...

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Bibliographic Details

Published in:	2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD) pp. 1 - 8
Main Authors:	Lee, Kyeongho, Kim, Joonhyung, Park, Jongsun
Format:	Conference Proceeding
Language:	English
Published:	ACM 30.10.2022
Subjects:	Compute-in-memory (CIM) Costs Degradation In-SRAM reference voltage generation Monte Carlo methods Random access memory Semiconductor device modeling SRAM Training variation-aware training Voltage
ISSN:	1558-2434
Online Access:	Get full text
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