The StageNet fabric for constructing resilient multicore systems

Scaling of CMOS feature size has long been a source of dramatic performance gains. However, the reduction in voltage levels has not been able to match this rate of scaling, leading to increasing operating temperatures and current densities. Given that most wearout mechanisms that plague semiconducto...

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Bibliographic Details
Published in:	2008 41st IEEE/ACM International Symposium on Microarchitecture pp. 141 - 151
Main Authors:	Gupta, Shantanu, Feng, Shuguang, Ansari, Amin, Blome, Jason, Mahlke, Scott
Format:	Conference Proceeding
Language:	English
Published:	Washington, DC, USA IEEE Computer Society 08.11.2008 IEEE
Series:	ACM Conferences
Subjects:	Computer systems organization Computer systems organization > Dependable and fault-tolerant systems and networks Current density Fabrics General and reference General and reference > Cross-computing tools and techniques General and reference > Cross-computing tools and techniques > Performance Hardware Hardware > Hardware validation Multicore processing Networks Networks > Network performance evaluation Performance gain Redundancy Semiconductor devices Space technology Temperature Tin Voltage
ISBN:	9781424428366, 142442836X
ISSN:	1072-4451
Online Access:	Get full text
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