Ko, Y., & Burgstaller, B. (2024, March 2). BEC: Bit-Level Static Analysis for Reliability against Soft Errors. Proceedings / International Symposium on Code Generation and Optimization, 283-295. https://doi.org/10.1109/CGO57630.2024.10444844
Chicago Style (17th ed.) CitationKo, Yousun, and Bernd Burgstaller. "BEC: Bit-Level Static Analysis for Reliability Against Soft Errors." Proceedings / International Symposium on Code Generation and Optimization 2 Mar. 2024: 283-295. https://doi.org/10.1109/CGO57630.2024.10444844.
MLA (9th ed.) CitationKo, Yousun, and Bernd Burgstaller. "BEC: Bit-Level Static Analysis for Reliability Against Soft Errors." Proceedings / International Symposium on Code Generation and Optimization, 2 Mar. 2024, pp. 283-295, https://doi.org/10.1109/CGO57630.2024.10444844.