Ko, Y., & Burgstaller, B. (2024, March 2). BEC: Bit-Level Static Analysis for Reliability against Soft Errors. Proceedings / International Symposium on Code Generation and Optimization, 283-295. https://doi.org/10.1109/CGO57630.2024.10444844
Chicago-Zitierstil (17. Ausg.)Ko, Yousun, und Bernd Burgstaller. "BEC: Bit-Level Static Analysis for Reliability Against Soft Errors." Proceedings / International Symposium on Code Generation and Optimization 2 Mar. 2024: 283-295. https://doi.org/10.1109/CGO57630.2024.10444844.
MLA-Zitierstil (9. Ausg.)Ko, Yousun, und Bernd Burgstaller. "BEC: Bit-Level Static Analysis for Reliability Against Soft Errors." Proceedings / International Symposium on Code Generation and Optimization, 2 Mar. 2024, pp. 283-295, https://doi.org/10.1109/CGO57630.2024.10444844.