APA (7th ed.) Citation

Liu, C., Hu, M., Strachan, J. P., & Li, H. (2017, June). Rescuing memristor-based neuromorphic design with high defects. 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC), 1-6. https://doi.org/10.1145/3061639.3062310

Chicago Style (17th ed.) Citation

Liu, Chenchen, Miao Hu, John Paul Strachan, and Hai Li. "Rescuing Memristor-based Neuromorphic Design with High Defects." 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC) Jun. 2017: 1-6. https://doi.org/10.1145/3061639.3062310.

MLA (9th ed.) Citation

Liu, Chenchen, et al. "Rescuing Memristor-based Neuromorphic Design with High Defects." 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC), Jun. 2017, pp. 1-6, https://doi.org/10.1145/3061639.3062310.