Kim, T., Sun, Z., Cook, C., Gaddipati, J., Wang, H., Chen, H., & Tan, S. X. (2016, November). Dynamic reliability management for near-threshold dark silicon processors. Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design, 1-7. https://doi.org/10.1145/2966986.2980080
Citácia podle Chicago (17th ed.)Kim, Taeyoung, Zeyu Sun, Chase Cook, Jagadeesh Gaddipati, Hai Wang, Haibao Chen, a Sheldon X.-D Tan. "Dynamic Reliability Management for Near-threshold Dark Silicon Processors." Digest of Technical Papers - IEEE/ACM International Conference on Computer-Aided Design Nov. 2016: 1-7. https://doi.org/10.1145/2966986.2980080.
Citácia podľa MLA (8th ed.)Kim, Taeyoung, et al. "Dynamic Reliability Management for Near-threshold Dark Silicon Processors." Digest of Technical Papers - IEEE/ACM International Conference on Computer-Aided Design, Nov. 2016, pp. 1-7, https://doi.org/10.1145/2966986.2980080.