EMGraph: Fast Learning-Based Electromigration Analysis for Multi-Segment Interconnect Using Graph Convolution Networks

Electromigration (EM) becomes a major concern for VLSI circuits as the technology advances in the nanometer regime. With Korhonen equations, EM assessment for VLSI circuits remains challenged due to the increasing integrated density. VLSI multisegment interconnect trees can be naturally viewed as gr...

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Bibliographic Details

Published in:	2021 58th ACM/IEEE Design Automation Conference (DAC) pp. 919 - 924
Main Authors:	Jin, Wentian, Chen, Liang, Sadiqbatcha, Sheriff, Peng, Shaoyi, Tan, Sheldon X.-D.
Format:	Conference Proceeding
Language:	English
Published:	IEEE 05.12.2021
Subjects:	Convolution Electromigration Electromigration (EM) Generative adversarial networks graph convolution network (GCN) hydrostatic stress assessment Image edge detection Integrated circuit interconnections multisegment interconnect Predictive models Very large scale integration
Online Access:	Get full text
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