Jin, W., Chen, L., Sadiqbatcha, S., Peng, S., & Tan, S. X. (2021, December 5). EMGraph: Fast Learning-Based Electromigration Analysis for Multi-Segment Interconnect Using Graph Convolution Networks. 2021 58th ACM/IEEE Design Automation Conference (DAC), 919-924. https://doi.org/10.1109/DAC18074.2021.9586239
Chicago-Zitierstil (17. Ausg.)Jin, Wentian, Liang Chen, Sheriff Sadiqbatcha, Shaoyi Peng, und Sheldon X.-D Tan. "EMGraph: Fast Learning-Based Electromigration Analysis for Multi-Segment Interconnect Using Graph Convolution Networks." 2021 58th ACM/IEEE Design Automation Conference (DAC) 5 Dec. 2021: 919-924. https://doi.org/10.1109/DAC18074.2021.9586239.
MLA-Zitierstil (9. Ausg.)Jin, Wentian, et al. "EMGraph: Fast Learning-Based Electromigration Analysis for Multi-Segment Interconnect Using Graph Convolution Networks." 2021 58th ACM/IEEE Design Automation Conference (DAC), 5 Dec. 2021, pp. 919-924, https://doi.org/10.1109/DAC18074.2021.9586239.