DIALED: Data Integrity Attestation for Low-end Embedded Devices

Verifying integrity of software execution in low-end microcontroller units (MCUs) is a well-known open problem. The central challenge is how to securely detect software exploits with minimal overhead, since these MCUs are designed for low cost, low energy and small size. Some recent work yielded ine...

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Bibliographic Details
Published in:	2021 58th ACM/IEEE Design Automation Conference (DAC) pp. 313 - 318
Main Authors:	De Oliveira Nunes, Ivan, Jakkamsetti, Sashidhar, Tsudik, Gene
Format:	Conference Proceeding
Language:	English
Published:	IEEE 05.12.2021
Subjects:	Codes Costs Data integrity Design automation Microcontrollers Performance evaluation Runtime
Online Access:	Get full text
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