DIALED: Data Integrity Attestation for Low-end Embedded Devices

Verifying integrity of software execution in low-end microcontroller units (MCUs) is a well-known open problem. The central challenge is how to securely detect software exploits with minimal overhead, since these MCUs are designed for low cost, low energy and small size. Some recent work yielded ine...

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Vydáno v:2021 58th ACM/IEEE Design Automation Conference (DAC) s. 313 - 318
Hlavní autoři: De Oliveira Nunes, Ivan, Jakkamsetti, Sashidhar, Tsudik, Gene
Médium: Konferenční příspěvek
Jazyk:angličtina
Vydáno: IEEE 05.12.2021
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Abstract Verifying integrity of software execution in low-end microcontroller units (MCUs) is a well-known open problem. The central challenge is how to securely detect software exploits with minimal overhead, since these MCUs are designed for low cost, low energy and small size. Some recent work yielded inexpensive hardware/software co-designs for remotely verifying code and execution integrity. In particular, a means of detecting unauthorized code modifications and control-flow attacks were proposed, referred to as Remote Attestation (ℛA) and Control-Flow Attestation (CFA), respectively. Despite this progress, detection of data-only attacks remains elusive. Such attacks exploit software vulnerabilities to corrupt intermediate computation results stored in data memory, changing neither the program code nor its control flow. Motivated by lack of any current techniques (for low-end MCUs) that detect these attacks, in this paper we propose, implement and evaluate DIALED, the first Data-Flow Attestation (CFA) technique applicable to the most resource-constrained embedded devices (e.g., TI MSP430). DIALED works in tandem with a companion CFA scheme to detect all (currently known) types of runtime software exploits at fairly low cost.
AbstractList Verifying integrity of software execution in low-end microcontroller units (MCUs) is a well-known open problem. The central challenge is how to securely detect software exploits with minimal overhead, since these MCUs are designed for low cost, low energy and small size. Some recent work yielded inexpensive hardware/software co-designs for remotely verifying code and execution integrity. In particular, a means of detecting unauthorized code modifications and control-flow attacks were proposed, referred to as Remote Attestation (ℛA) and Control-Flow Attestation (CFA), respectively. Despite this progress, detection of data-only attacks remains elusive. Such attacks exploit software vulnerabilities to corrupt intermediate computation results stored in data memory, changing neither the program code nor its control flow. Motivated by lack of any current techniques (for low-end MCUs) that detect these attacks, in this paper we propose, implement and evaluate DIALED, the first Data-Flow Attestation (CFA) technique applicable to the most resource-constrained embedded devices (e.g., TI MSP430). DIALED works in tandem with a companion CFA scheme to detect all (currently known) types of runtime software exploits at fairly low cost.
Author Jakkamsetti, Sashidhar
Tsudik, Gene
De Oliveira Nunes, Ivan
Author_xml – sequence: 1
  givenname: Ivan
  surname: De Oliveira Nunes
  fullname: De Oliveira Nunes, Ivan
  email: ivanoliv@uci.edu
  organization: University of California,Irvine
– sequence: 2
  givenname: Sashidhar
  surname: Jakkamsetti
  fullname: Jakkamsetti, Sashidhar
  email: sjakkams@uci.edu
  organization: University of California,Irvine
– sequence: 3
  givenname: Gene
  surname: Tsudik
  fullname: Tsudik, Gene
  email: gene.tsudik@uci.edu
  organization: University of California,Irvine
BookMark eNotj8tKxDAYRiMoqGOfQIS8QGsuzc2NlHZGCwU3uh7S5P8l4LTSBmXe3gFn8x3O5sB3Sy6neQJCHjirOGfusWtabpmpK8EEr5yy-qQXpHDGcq1VLYWp2TUp1jWNTDNl69PekOeub4Zt90Q7nz3tpwyfS8pH2uQMa_Y5zRPFeaHD_FvCFOn2MEKMEGkHPynAekeu0H-tUJy5IR-77Xv7Wg5vL33bDKUX1uRSKK0ZCjaiGNEhRme0URIVelmj1jIgD6PydrQcwQWjI5OKccmDcEGC3JD7_24CgP33kg5-Oe7PN-Uf3EFJOg
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/DAC18074.2021.9586180
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 9781665432740
1665432748
EndPage 318
ExternalDocumentID 9586180
Genre orig-research
GrantInformation_xml – fundername: Semiconductor Research Corporation
  funderid: 10.13039/100000028
GroupedDBID 6IE
6IH
ACM
ALMA_UNASSIGNED_HOLDINGS
CBEJK
RIE
RIO
ID FETCH-LOGICAL-a287t-25660f20bf2bf9ffd976753f5fa34f663cf1cb5a8b81fe9c76d0350131c29c3e3
IEDL.DBID RIE
ISICitedReferencesCount 14
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000766079700053&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
IngestDate Wed Aug 27 02:28:29 EDT 2025
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-a287t-25660f20bf2bf9ffd976753f5fa34f663cf1cb5a8b81fe9c76d0350131c29c3e3
PageCount 6
ParticipantIDs ieee_primary_9586180
PublicationCentury 2000
PublicationDate 2021-Dec.-5
PublicationDateYYYYMMDD 2021-12-05
PublicationDate_xml – month: 12
  year: 2021
  text: 2021-Dec.-5
  day: 05
PublicationDecade 2020
PublicationTitle 2021 58th ACM/IEEE Design Automation Conference (DAC)
PublicationTitleAbbrev DAC
PublicationYear 2021
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssib060584060
Score 2.328045
Snippet Verifying integrity of software execution in low-end microcontroller units (MCUs) is a well-known open problem. The central challenge is how to securely detect...
SourceID ieee
SourceType Publisher
StartPage 313
SubjectTerms Codes
Costs
Data integrity
Design automation
Microcontrollers
Performance evaluation
Runtime
Title DIALED: Data Integrity Attestation for Low-end Embedded Devices
URI https://ieeexplore.ieee.org/document/9586180
WOSCitedRecordID wos000766079700053&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LSwMxEA61ePCk0opvcvDotpvNJtl4kdJtsVBKDwq9lbwGPLiVdqt_3yRdK4IXbyEQwuQx3zeZzAxCd0bn2giTJ0T425Qz8FeKKpZIJyTPbJYXALHYhJjNisVCzlvofh8L45yLn89cLzSjL9-uzDY8lfUlKzgpvIF-IATfxWp9n53g3fPYlDZBOiSV_XIwJCHVizcCM9Jrxv4qohIxZHz8v9lPUPcnGA_P9zBzilqu6qDHcjKYjsoHXKpa4UnM-eD5NB7UnjruvOvY01E8XX0mrrJ49KadVzEWly6qhi56GY-eh09JUwshUd6mqRPPTHgKWaoh0yABrAxZWCgwUDQHTxsMEKOZKnRBwEkjuI0-Q0pMJg119Ay1q1XlzhFOmeNKe2SG1HjjjGhmWW4DMFkDjNML1AnCL9936S6WjdyXf3dfoaOwvvGHB7tG7Xq9dTfo0HzUr5v1bdyjL69EkPg
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LSwMxEA6lCnpSacW3OXh022Q32d14kdJtaXEtPVTorWweAx7clrrVv2-SrhXBi7cQCGHymO-bTGYGoTslmVSJYgFN7G1iHOyVigoeCJOIONQhSwF8sYlkMknnczFtoPtdLIwxxn8-Mx3X9L58vVQb91TWFTyNaWoN9D3OWEi20Vrfp8f59yw6kTpMhxLRzXp96pK9WDMwpJ169K8yKh5Fhkf_m_8YtX_C8fB0BzQnqGHKFnrMxr18kD3grKgKPPZZHyyjxr3Kksetfx1bQorz5WdgSo0Hb9JYJaNxZrxyaKOX4WDWHwV1NYSgsFZNFVhuEhMIiYRQggDQwuVhiYBDETGwxEEBVZIXqUwpGKGSWHuvYURVKFRkolPULJelOUOYcBMX0mIzEGXNMyq55kw7aNIKeBydo5YTfrHaJrxY1HJf_N19iw5Gs-d8kY8nT5fo0K21_-_Br1CzWm_MNdpXH9Xr-_rG79cXbhCUPw
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2021+58th+ACM%2FIEEE+Design+Automation+Conference+%28DAC%29&rft.atitle=DIALED%3A+Data+Integrity+Attestation+for+Low-end+Embedded+Devices&rft.au=De+Oliveira+Nunes%2C+Ivan&rft.au=Jakkamsetti%2C+Sashidhar&rft.au=Tsudik%2C+Gene&rft.date=2021-12-05&rft.pub=IEEE&rft.spage=313&rft.epage=318&rft_id=info:doi/10.1109%2FDAC18074.2021.9586180&rft.externalDocID=9586180