Citace podle APA (7th ed.)

De Oliveira Nunes, I., Jakkamsetti, S., & Tsudik, G. (2021, December 5). DIALED: Data Integrity Attestation for Low-end Embedded Devices. 2021 58th ACM/IEEE Design Automation Conference (DAC), 313-318. https://doi.org/10.1109/DAC18074.2021.9586180

Citace podle Chicago (17th ed.)

De Oliveira Nunes, Ivan, Sashidhar Jakkamsetti, a Gene Tsudik. "DIALED: Data Integrity Attestation for Low-end Embedded Devices." 2021 58th ACM/IEEE Design Automation Conference (DAC) 5 Dec. 2021: 313-318. https://doi.org/10.1109/DAC18074.2021.9586180.

Citace podle MLA (9th ed.)

De Oliveira Nunes, Ivan, et al. "DIALED: Data Integrity Attestation for Low-end Embedded Devices." 2021 58th ACM/IEEE Design Automation Conference (DAC), 5 Dec. 2021, pp. 313-318, https://doi.org/10.1109/DAC18074.2021.9586180.

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