DeepLocalize: Fault Localization for Deep Neural Networks
Deep Neural Networks (DNNs) are becoming an integral part of most software systems. Previous work has shown that DNNs have bugs. Unfortunately, existing debugging techniques don't support localizing DNN bugs because of the lack of understanding of model behaviors. The entire DNN model appears a...
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| Vydané v: | Proceedings / International Conference on Software Engineering s. 251 - 262 |
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| Hlavní autori: | , , |
| Médium: | Konferenčný príspevok.. |
| Jazyk: | English |
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IEEE
01.05.2021
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| ISBN: | 1665402962, 9781665402965 |
| ISSN: | 1558-1225 |
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| Abstract | Deep Neural Networks (DNNs) are becoming an integral part of most software systems. Previous work has shown that DNNs have bugs. Unfortunately, existing debugging techniques don't support localizing DNN bugs because of the lack of understanding of model behaviors. The entire DNN model appears as a black box. To address these problems, we propose an approach and a tool that automatically determines whether the model is buggy or not, and identifies the root causes for DNN errors. Our key insight is that historic trends in values propagated between layers can be analyzed to identify faults, and also localize faults. To that end, we first enable dynamic analysis of deep learning applications: by converting it into an imperative representation and alternatively using a callback mechanism. Both mechanisms allows us to insert probes that enable dynamic analysis over the traces produced by the DNN while it is being trained on the training data. We then conduct dynamic analysis over the traces to identify the faulty layer or hyperparameter that causes the error. We propose an algorithm for identifying root causes by capturing any numerical error and monitoring the model during training and finding the relevance of every layer/parameter on the DNN outcome. We have collected a benchmark containing 40 buggy models and patches that contain real errors in deep learning applications from Stack Overflow and GitHub. Our benchmark can be used to evaluate automated debugging tools and repair techniques. We have evaluated our approach using this DNN bug-and-patch benchmark, and the results showed that our approach is much more effective than the existing debugging approach used in the state-of-the-practice Keras library. For 34/40 cases, our approach was able to detect faults whereas the best debugging approach provided by Keras detected 32/40 faults. Our approach was able to localize 21/40 bugs whereas Keras did not localize any faults. |
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| AbstractList | Deep Neural Networks (DNNs) are becoming an integral part of most software systems. Previous work has shown that DNNs have bugs. Unfortunately, existing debugging techniques don't support localizing DNN bugs because of the lack of understanding of model behaviors. The entire DNN model appears as a black box. To address these problems, we propose an approach and a tool that automatically determines whether the model is buggy or not, and identifies the root causes for DNN errors. Our key insight is that historic trends in values propagated between layers can be analyzed to identify faults, and also localize faults. To that end, we first enable dynamic analysis of deep learning applications: by converting it into an imperative representation and alternatively using a callback mechanism. Both mechanisms allows us to insert probes that enable dynamic analysis over the traces produced by the DNN while it is being trained on the training data. We then conduct dynamic analysis over the traces to identify the faulty layer or hyperparameter that causes the error. We propose an algorithm for identifying root causes by capturing any numerical error and monitoring the model during training and finding the relevance of every layer/parameter on the DNN outcome. We have collected a benchmark containing 40 buggy models and patches that contain real errors in deep learning applications from Stack Overflow and GitHub. Our benchmark can be used to evaluate automated debugging tools and repair techniques. We have evaluated our approach using this DNN bug-and-patch benchmark, and the results showed that our approach is much more effective than the existing debugging approach used in the state-of-the-practice Keras library. For 34/40 cases, our approach was able to detect faults whereas the best debugging approach provided by Keras detected 32/40 faults. Our approach was able to localize 21/40 bugs whereas Keras did not localize any faults. |
| Author | Le, Wei Rajan, Hridesh Wardat, Mohammad |
| Author_xml | – sequence: 1 givenname: Mohammad surname: Wardat fullname: Wardat, Mohammad email: wardat@iastate.edu organization: Iowa State University, USA – sequence: 2 givenname: Wei surname: Le fullname: Le, Wei email: weile@iastate.edu organization: Iowa State University, USA – sequence: 3 givenname: Hridesh surname: Rajan fullname: Rajan, Hridesh email: hridesh@iastate.edu organization: Iowa State University, USA |
| BookMark | eNotj81Kw1AUhC9Ywbb2CXSRF0g85_4l153EVgvBLqrrcm5yLgRjUpIU0ac3xW7mm4FhYBZi1nYtC3GPkCCCe9jm-7VWDmQiQWICAEpfiQVaazRIZ-VMzNGYLEYpzY1YDUPtQevUIVg9F-6Z-Vh0JTX1Lz9GGzo1Y3TJNNZdG4Wuj86l6I1PPTUTxu-u_xxuxXWgZuDVhUvxsVm_569xsXvZ5k9FTDIzY2w5CwSeAhqvtVelxRCQPTuuUouqqrQO4NVkUjhL6pm1DGVGKMlbtRR3_7s1Mx-Off1F_c_BTefAGvUHIx1KVw |
| CODEN | IEEPAD |
| ContentType | Conference Proceeding |
| DBID | 6IE 6IH CBEJK RIE RIO |
| DOI | 10.1109/ICSE43902.2021.00034 |
| DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan (POP) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE/IET Electronic Library (IEL) (UW System Shared) IEEE Proceedings Order Plans (POP) 1998-present |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE Xplore url: https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Computer Science |
| EndPage | 262 |
| ExternalDocumentID | 9402065 |
| Genre | orig-research |
| GrantInformation_xml | – fundername: National Science Foundation funderid: 10.13039/100000001 |
| GroupedDBID | -~X .4S .DC 123 23M 29O 5VS 6IE 6IF 6IH 6IK 6IL 6IM 6IN 8US AAJGR AAWTH ABLEC ADZIZ AFFNX ALMA_UNASSIGNED_HOLDINGS APO ARCSS AVWKF BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK CHZPO EDO FEDTE I-F I07 IEGSK IJVOP IPLJI M43 OCL RIE RIL RIO RNS XOL |
| ID | FETCH-LOGICAL-a285t-6e8fa0baf15b44b3c61ff1ebe9ed7613dd44f0b33dd703dd77bee42fc8a12ab63 |
| IEDL.DBID | RIE |
| ISBN | 1665402962 9781665402965 |
| ISICitedReferencesCount | 79 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000684601800021&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| ISSN | 1558-1225 |
| IngestDate | Wed Aug 27 02:28:03 EDT 2025 |
| IsPeerReviewed | false |
| IsScholarly | true |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-a285t-6e8fa0baf15b44b3c61ff1ebe9ed7613dd44f0b33dd703dd77bee42fc8a12ab63 |
| PageCount | 12 |
| ParticipantIDs | ieee_primary_9402065 |
| PublicationCentury | 2000 |
| PublicationDate | 2021-May |
| PublicationDateYYYYMMDD | 2021-05-01 |
| PublicationDate_xml | – month: 05 year: 2021 text: 2021-May |
| PublicationDecade | 2020 |
| PublicationTitle | Proceedings / International Conference on Software Engineering |
| PublicationTitleAbbrev | ICSE |
| PublicationYear | 2021 |
| Publisher | IEEE |
| Publisher_xml | – name: IEEE |
| SSID | ssib044791064 ssj0006499 |
| Score | 2.530428 |
| Snippet | Deep Neural Networks (DNNs) are becoming an integral part of most software systems. Previous work has shown that DNNs have bugs. Unfortunately, existing... |
| SourceID | ieee |
| SourceType | Publisher |
| StartPage | 251 |
| SubjectTerms | Benchmark testing Computer bugs Debugging Deep learning bugs Deep Neural Networks Fault diagnosis Fault Location Neural networks Numerical models Program Analysis |
| Title | DeepLocalize: Fault Localization for Deep Neural Networks |
| URI | https://ieeexplore.ieee.org/document/9402065 |
| WOSCitedRecordID | wos000684601800021&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1La8JAEF5UeujJtlr6Zg89NrrZ7CPp1SotFBHagjfZxywIoqJJD_313V2jpdBLL0k25BBmdvPNbOabD6F7DdRaSWxiuKIJYzwsKZEmVsucaO204S6KTcjxOJ9Oi0kDPRy4MAAQi8-gFy7jv3y7MlXYKusXIdkRvImaUoodV2s_dxiTHvhC6F9_hQWL2pEeLn2W5CdtIHUFpV1CC0HrXk_7Ma85dSkp-i-Dt6EH6UjSomkvNnD5pbwSgWfU_t8rn6DuD4MPTw7YdIoasDxD7b2EA65XdAcVTwDr14Bn8y94xCNVLUpcj6PPsA9qcXgIhzYeauFPsW5820Ufo-H74Dmp1RQSRXNeJgJyp4hWLuWaMZ0ZkTqXeh8WYKUHdWsZc0RnWfBdOEgNwKgzuUqp0iI7R63lagkXCBeZJRzA-WTHMaKNtyUF7wLw4Y0CQy9RJ1hitt41zJjVRrj6-_Y1Og6m3lUR3qBWuangFh2Zz3K-3dxFL38D8eKhcw |
| linkProvider | IEEE |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LTwIxEG4QTfSECsa3PXh0odtt9-EVIRCRkIgJN9LHNCEhQHh48NfbloIx8eJld7vZw2am3W-mO998CD1KoFpnREeKCxoxxt2SSuNIyywnUhqpuPFiE1m_n49GxaCEnvZcGADwxWdQd5f-X76eq43bKmsULtlJ-QE6dMpZga21mz2MZRb6XPAfvsMp8-qRFjBtnmSnraN1Oa1dQouUhm5PuzEPrLqYFI1u871lYdrTtGhc9y1cfmmveOhpV_730qeo9sPhw4M9Op2hEszOUWUn4oDDmq6i4gVg0XOINvmCZ9wWm-kah7H3GrZhLXYPYdfIQ0ztyVeOr2roo90aNjtR0FOIBM35OkohN4JIYWIuGZOJSmNjYuvFAnRmYV1rxgyRSeK85w6ZBGDUqFzEVMg0uUDl2XwGlwgXiSYcwNh0xzAilbUlBesCsAGOAEWvUNVZYrzYtswYByNc_337AR13hm-9ca_bf71BJ87s25rCW1ReLzdwh47U53qyWt57j38Dk66kvA |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Proceedings+%2F+International+Conference+on+Software+Engineering&rft.atitle=DeepLocalize%3A+Fault+Localization+for+Deep+Neural+Networks&rft.au=Wardat%2C+Mohammad&rft.au=Le%2C+Wei&rft.au=Rajan%2C+Hridesh&rft.date=2021-05-01&rft.pub=IEEE&rft.isbn=9781665402965&rft.issn=1558-1225&rft.spage=251&rft.epage=262&rft_id=info:doi/10.1109%2FICSE43902.2021.00034&rft.externalDocID=9402065 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1558-1225&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1558-1225&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1558-1225&client=summon |

