APA (7th ed.) Citation

Wen, X., Wang, X., Gao, C., Wang, S., Liu, Y., & Gu, Z. (2023, September 11). When Less is Enough: Positive and Unlabeled Learning Model for Vulnerability Detection. IEEE/ACM International Conference on Automated Software Engineering : [proceedings], 345-357. https://doi.org/10.1109/ASE56229.2023.00144

Chicago Style (17th ed.) Citation

Wen, Xin-Cheng, Xinchen Wang, Cuiyun Gao, Shaohua Wang, Yang Liu, and Zhaoquan Gu. "When Less Is Enough: Positive and Unlabeled Learning Model for Vulnerability Detection." IEEE/ACM International Conference on Automated Software Engineering : [proceedings] 11 Sep. 2023: 345-357. https://doi.org/10.1109/ASE56229.2023.00144.

MLA (9th ed.) Citation

Wen, Xin-Cheng, et al. "When Less Is Enough: Positive and Unlabeled Learning Model for Vulnerability Detection." IEEE/ACM International Conference on Automated Software Engineering : [proceedings], 11 Sep. 2023, pp. 345-357, https://doi.org/10.1109/ASE56229.2023.00144.