On the Analysis of Reed Solomon Coding for Resilience to Transient/Permanent Faults in Highly Reliable Memories

Single Event Upsets (SEU) as well as permanent faults can significantly affect the correct on-line operation of digital systems, such as memories and microprocessors; a memory can be made resilient to permanent and transient faults by using modular redundancy and coding. In this paper, different mem...

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Vydané v:Design, Automation and Test in Europe s. 580 - 585
Hlavní autori: Schiano, L., Ottavi, M., Lombardi, F., Pontarelli, S., Salsano, A.
Médium: Konferenčný príspevok..
Jazyk:English
Vydavateľské údaje: Washington, DC, USA IEEE Computer Society 07.03.2005
IEEE
Edícia:ACM Conferences
Predmet:
Digital systems
Dynamic Redundancy
Error correction
Fault detection
Hardware > Hardware test
Hardware > Integrated circuits > Semiconductor memory > Dynamic memory
Hardware > Robustness
High Reliability Systems
Mathematics of computing > Information theory
Mathematics of computing > Information theory > Coding theory
Mathematics of computing > Probability and statistics > Probabilistic representations > Markov networks
Mathematics of computing > Probability and statistics > Stochastic processes > Markov processes
Microprocessors
Performance analysis
Redundancy
Reed-Solomon codes
Reliability Evaluation
Resilience
Scrubbing
Security and privacy > Cryptography > Mathematical foundations of cryptography
Single event upset
Theory of computation > Theory and algorithms for application domains > Machine learning theory > Markov decision processes
Transient analysis
Reliability Evaluation
High Reliability Systems
Scrubbing
Reed-Solomon Codes
Dynamic Redundancy
ISBN:9780769522883, 0769522882
ISSN:1530-1591
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Shrnutí:Single Event Upsets (SEU) as well as permanent faults can significantly affect the correct on-line operation of digital systems, such as memories and microprocessors; a memory can be made resilient to permanent and transient faults by using modular redundancy and coding. In this paper, different memory systems are compared: these systems utilize simplex and duplex arrangements with a combination of Reed Solomon coding and scrubbing. The memory systems and their operations are analyzed by novel Markov chains to characterize performance for dynamic reconfiguration as well as error detection and correction under the occurrence of permanent and transient faults. For a specific Reed Solomon code, the duplex arrangement allows to efficiently cope with the occurrence of permanent faults, while the use of scrubbing allows to cope with transient faults.
Bibliografia:SourceType-Conference Papers & Proceedings-1
ObjectType-Conference Paper-1
content type line 25
ISBN:9780769522883
0769522882
ISSN:1530-1591
DOI:10.1109/DATE.2005.227