Schiano, L., Ottavi, M., Lombardi, F., Pontarelli, S., & Salsano, A. (2005, March 7). On the Analysis of Reed Solomon Coding for Resilience to Transient/Permanent Faults in Highly Reliable Memories. Design, Automation and Test in Europe, 580-585. https://doi.org/10.1109/DATE.2005.227
Citace podle Chicago (17th ed.)Schiano, L., M. Ottavi, F. Lombardi, S. Pontarelli, a A. Salsano. "On the Analysis of Reed Solomon Coding for Resilience to Transient/Permanent Faults in Highly Reliable Memories." Design, Automation and Test in Europe 7 Mar. 2005: 580-585. https://doi.org/10.1109/DATE.2005.227.
Citace podle MLA (9th ed.)Schiano, L., et al. "On the Analysis of Reed Solomon Coding for Resilience to Transient/Permanent Faults in Highly Reliable Memories." Design, Automation and Test in Europe, 7 Mar. 2005, pp. 580-585, https://doi.org/10.1109/DATE.2005.227.