Li, P., Liu, F., Li, X., Pileggi, L. T., & Nassif, S. R. (2005, March 7). Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction. Design, Automation and Test in Europe, 958-963. https://doi.org/10.1109/DATE.2005.213
Chicago Style (17th ed.) CitationLi, Peng, Frank Liu, Xin Li, Lawrence T. Pileggi, and Sani R. Nassif. "Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction." Design, Automation and Test in Europe 7 Mar. 2005: 958-963. https://doi.org/10.1109/DATE.2005.213.
MLA (9th ed.) CitationLi, Peng, et al. "Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction." Design, Automation and Test in Europe, 7 Mar. 2005, pp. 958-963, https://doi.org/10.1109/DATE.2005.213.