Accurate Reliability Evaluation and Enhancement via Probabilistic Transfer Matrices

Soft errors are an increasingly serious problem for logic circuits. To estimate the effects of soft errors on such circuits, we develop a general computational framework based on probabilistic transfer matrices (PTMs). In particular, we apply them to evaluate circuit reliability in the presence of s...

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Bibliographic Details
Published in:	Design, Automation and Test in Europe pp. 282 - 287
Main Authors:	Krishnaswamy, Smita, Viamontes, George F., Markov, Igor L., Hayes, John P.
Format:	Conference Proceeding
Language:	English
Published:	Washington, DC, USA IEEE Computer Society 07.03.2005 IEEE
Series:	ACM Conferences
Subjects:	Atmospheric modeling Circuit analysis Computer architecture Data mining Hardware > Hardware test Hardware > Hardware validation > Functional verification Hardware > Robustness Hardware > Very large scale integration design Logic circuits Mathematics of computing > Mathematical analysis > Numerical analysis > Computations on matrices Neutrons Observability Power system reliability Probability Tensile stress
ISBN:	9780769522883, 0769522882
ISSN:	1530-1591
Online Access:	Get full text
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