Conflict driven learning in a quantified Boolean Satisfiability solver

Within the verification community, there has been a recent increase in interest in Quantified Boolean Formula evaluation (QBF) as many interesting sequential circuit verification problems can be formulated as QBF instances. A closely related research area to QBF is Boolean Satisfiability (SAT). Rece...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design S. 442 - 449
Hauptverfasser: Zhang, Lintao, Malik, Sharad
Format: Tagungsbericht
Sprache:Englisch
Veröffentlicht: New York, NY, USA ACM 10.11.2002
IEEE
Schriftenreihe:ACM Conferences
Schlagworte:
ISBN:0780376072, 9780780376076
ISSN:1092-3152
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Within the verification community, there has been a recent increase in interest in Quantified Boolean Formula evaluation (QBF) as many interesting sequential circuit verification problems can be formulated as QBF instances. A closely related research area to QBF is Boolean Satisfiability (SAT). Recent advances in SAT research have resulted in some very efficient SAT solvers. One of the critical techniques employed in these solvers is Conflict Driven Learning. In this paper, we adapt conflict driven learning for application in a QBF setting. We show that conflict driven learning can be regarded as a resolution process on the clauses. We prove that under certain conditions, tautology clauses obtained from resolution in QBF also obey the rules for implication and conflicts of regular (non-tautology) clauses; and therefore they can be treated as regular clauses and used in future search. We have implemented this idea in a new QBF solver called Quaffle and our initial experiments show that conflict driven learning can greatly speed up the solution process for most of the benchmarks we tested.
Bibliographie:SourceType-Conference Papers & Proceedings-1
ObjectType-Conference Paper-1
content type line 25
ISBN:0780376072
9780780376076
ISSN:1092-3152
DOI:10.1145/774572.774637