Effective static deadlock detection

We present an effective static deadlock detection algorithm for Java. Our algorithm uses a novel combination of static analyses each of which approximates a different necessary condition for a deadlock. We have implemented the algorithm and report upon our experience applying it to a suite of multi-...

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Published in:2009 IEEE 31st International Conference on Software Engineering pp. 386 - 396
Main Authors: Naik, Mayur, Park, Chang-Seo, Sen, Koushik, Gay, David
Format: Conference Proceeding
Language:English
Published: Washington, DC, USA IEEE Computer Society 16.05.2009
IEEE
Series:ACM Conferences
Subjects:
ISBN:9781424434534, 142443453X
ISSN:0270-5257
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Abstract We present an effective static deadlock detection algorithm for Java. Our algorithm uses a novel combination of static analyses each of which approximates a different necessary condition for a deadlock. We have implemented the algorithm and report upon our experience applying it to a suite of multi-threaded Java programs. While neither sound nor complete, our approach is effective in practice, finding all known deadlocks as well as discovering previously unknown ones in our benchmarks with few false alarms.
AbstractList We present an effective static deadlock detection algorithm for Java. Our algorithm uses a novel combination of static analyses each of which approximates a different necessary condition for a deadlock. We have implemented the algorithm and report upon our experience applying it to a suite of multi-threaded Java programs. While neither sound nor complete, our approach is effective in practice, finding all known deadlocks as well as discovering previously unknown ones in our benchmarks with few false alarms.
Author Naik, Mayur
Park, Chang-Seo
Gay, David
Sen, Koushik
Author_xml – sequence: 1
  givenname: Mayur
  surname: Naik
  fullname: Naik, Mayur
  organization: Intel Research, USA
– sequence: 2
  givenname: Chang-Seo
  surname: Park
  fullname: Park, Chang-Seo
  organization: UC Berkeley, USA
– sequence: 3
  givenname: Koushik
  surname: Sen
  fullname: Sen, Koushik
  organization: UC Berkeley, USA
– sequence: 4
  givenname: David
  surname: Gay
  fullname: Gay, David
  organization: Intel Research, USA
BookMark eNqNkE1LxDAQhgOu4Lr2B4iXBW9C6ySTNMlRSlcXFjy495CkCdTdbaUtgv_elF3vzmE-eOYdmPeWLLq-C4TcUygoBf28rT7qggHoQoAEgeqKZFoqyhnnyAXyBVkCk5ALJuQNycbxE1IkQpVeksc6xuCn9jusx8lOrV83wTbH3h9SM82k7-7IdbTHMWSXuiL7Tb2v3vLd--u2etnllgk65TqWrJE0Wp9SROGVQ-WjSLOlcoZRlk5jSb3zZemV4hqDdIhO20BxRR7OZ9sQgvka2pMdfszlq0ThTK0_Gdf3h9FQMLMFZrbAzBb8LRs3tCEmydO_JfgLd6dcBQ
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/ICSE.2009.5070538
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Xplore
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList

Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Xplore
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Computer Science
EndPage 396
ExternalDocumentID 5070538
Genre orig-research
GroupedDBID 6IE
6IF
6IG
6IH
6IK
6IL
6IM
6IN
AAJGR
AARBI
ACM
ADPZR
ALMA_UNASSIGNED_HOLDINGS
APO
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
GUFHI
IERZE
OCL
RIE
RIL
RIO
-~X
.4S
.DC
123
23M
29O
5VS
8US
AAWTH
ABLEC
ADZIZ
AFFNX
ARCSS
AVWKF
CHZPO
EDO
FEDTE
I-F
I07
IEGSK
IJVOP
IPLJI
M43
RNS
XOL
ID FETCH-LOGICAL-a251t-9f62d71fac71ff35c8b38cf5ac7a17f62df76b9361cbc66c88493e7b33b9ae13
IEDL.DBID RIE
ISBN 9781424434534
142443453X
ISICitedReferencesCount 99
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000271438200036&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 0270-5257
IngestDate Wed Aug 27 02:04:01 EDT 2025
Wed Jan 31 06:38:21 EST 2024
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-a251t-9f62d71fac71ff35c8b38cf5ac7a17f62df76b9361cbc66c88493e7b33b9ae13
PageCount 11
ParticipantIDs acm_books_10_1109_ICSE_2009_5070538
ieee_primary_5070538
acm_books_10_1109_ICSE_2009_5070538_brief
PublicationCentury 2000
PublicationDate 20090516
2009-May
PublicationDateYYYYMMDD 2009-05-16
2009-05-01
PublicationDate_xml – month: 05
  year: 2009
  text: 20090516
  day: 16
PublicationDecade 2000
PublicationPlace Washington, DC, USA
PublicationPlace_xml – name: Washington, DC, USA
PublicationSeriesTitle ACM Conferences
PublicationTitle 2009 IEEE 31st International Conference on Software Engineering
PublicationTitleAbbrev ICSE
PublicationYear 2009
Publisher IEEE Computer Society
IEEE
Publisher_xml – name: IEEE Computer Society
– name: IEEE
SSID ssj0000453189
ssj0006499
Score 2.108396
Snippet We present an effective static deadlock detection algorithm for Java. Our algorithm uses a novel combination of static analyses each of which approximates a...
SourceID ieee
acm
SourceType Publisher
StartPage 386
SubjectTerms Algorithm design and analysis
Concurrent computing
Data analysis
Detection algorithms
Java
Multicore processing
Software and its engineering -- Software creation and management -- Software verification and validation -- Software defect analysis -- Software testing and debugging
Software and its engineering -- Software notations and tools -- General programming languages -- Language features -- Concurrent programming structures
Software and its engineering -- Software notations and tools -- General programming languages -- Language types
Sun
System recovery
Yarn
Title Effective static deadlock detection
URI https://ieeexplore.ieee.org/document/5070538
WOSCitedRecordID wos000271438200036&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8NAEB5q8eCpaivWF4F6EYzNZtN9nEuLgpSCRXoLyT6giKn04e93dvMQwYNewm52IZvJZGdmZ74ZgFsxinMiuAq1JWigGJOEMhY6lIpb3BBVxny5t9dnPpuJ5VLOW3DfYGGMMT74zDy4pvfl67Xau6OyIeouyDPiAA44ZyVWqzlPQdUE2VM2uzBLfO1ItLqi0GX8rEFdFOct61xPVT-p3J0kksOn8cukTGNZPc2JLfX-o_iKlz3Tzv9WfQy9bxBfMG_E0wm0THEKnbqKQ1D91F0YlAmMcdcLHLpopQKN3x1l3Bs2dj5Sq-jBYjpZjB_DqnRCmKHCsgulZbHmxGYKL5aOlMipUHaE_YxwN2g5yyVlROWKMSVEIqnhOaW5zAyhZ9Au1oU5hyCmxrJIExVxlgiHVRCoNCmtpUh0rE0fBkie1JkE29RbFJFMHRFdgUuZVi_fh7s_zErzzcrYPnQdEdOPMt1GPXjx--1LOCodPC4G8Qrau83eXMOh-tyttpsbzyNfcCyvPg
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8NAEB5qFfRUtRXrM1AvgrFJNt3HubS0WEvBIr2FZB9QxFTa1N_vbJJGBA96CbvZhWwmk52ZnccHcMd7QeJzJl1lfDRQtA5dEXDlCskMbogypjnc2-uETad8sRCzGjxUuTBa6zz4TD_aZu7LVyu5tUdlXdRdkGf4Huxb5KwyW6s6UUHlBBlUVPswDXP0SLS7PNfW_NyldRGct9hVeyr7Yenw9D3RHfdfBkUhy_J5VnDJ9x_wK7n0GTb-t-5jaH2n8TmzSkCdQE2np9DY4Tg45W_dhE5Rwhj3PcfmFy2lo_DLo5R7w0aWx2qlLZgPB_P-yC3BE9wYVZbMFYYGivkmlngxpCd5Qrg0PezHPrODhtFEEOrLRFIqOQ8F0SwhJBGx9skZ1NNVqs_BCYg21FO-9BgNuc1W4Kg2SaUED1WgdBs6SJ7IGgWbKLcpPBFZIlqISxGVL9-G-z_MipL1Ups2NC0Ro4-i4MZu8OL327dwOJo_T6LJePp0CUeFu8dGJF5BPVtv9TUcyM9suVnf5PzyBczWsoc
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2009+IEEE+31st+International+Conference+on+Software+Engineering&rft.atitle=Effective+static+deadlock+detection&rft.au=Naik%2C+M.&rft.au=Chang-Seo+Park&rft.au=Koushik+Sen&rft.au=Gay%2C+D.&rft.date=2009-05-01&rft.pub=IEEE&rft.isbn=9781424434534&rft.issn=0270-5257&rft.spage=386&rft.epage=396&rft_id=info:doi/10.1109%2FICSE.2009.5070538&rft.externalDocID=5070538
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0270-5257&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0270-5257&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0270-5257&client=summon