Xie, Z., Li, S., Ma, M., Chang, C., Pan, J., Chen, Y., & Hu, J. (2022, October 29). DEEP: Developing Extremely Efficient Runtime On-Chip Power Meters. 2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 1-9. https://doi.org/10.1145/3508352.3549427
Citace podle Chicago (17th ed.)Xie, Zhiyao, Shiyu Li, Mingyuan Ma, Chen-Chia Chang, Jingyu Pan, Yiran Chen, a Jiang Hu. "DEEP: Developing Extremely Efficient Runtime On-Chip Power Meters." 2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD) 29 Oct. 2022: 1-9. https://doi.org/10.1145/3508352.3549427.
Citace podle MLA (9th ed.)Xie, Zhiyao, et al. "DEEP: Developing Extremely Efficient Runtime On-Chip Power Meters." 2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 29 Oct. 2022, pp. 1-9, https://doi.org/10.1145/3508352.3549427.