Automated Repair of Multi-fault Programs: Obstacles, Approaches, and Prospects

Modern automated program repair (APR) tools are well-tuned at repairing single fault programs (i.e., programs in which only one fault can occur at time). However, real-world software projects typically contain multiple bugs at the same time, which can interact with and mask each other in a variety o...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:IEEE/ACM International Conference on Automated Software Engineering : [proceedings] s. 2215 - 2219
Hlavní autor: Al-Bataineh, Omar I.
Médium: Konferenční příspěvek
Jazyk:angličtina
Vydáno: ACM 27.10.2024
Témata:
ISSN:2643-1572
On-line přístup:Získat plný text
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
Abstract Modern automated program repair (APR) tools are well-tuned at repairing single fault programs (i.e., programs in which only one fault can occur at time). However, real-world software projects typically contain multiple bugs at the same time, which can interact with and mask each other in a variety of ways. The complex interaction of faults in multi-fault programs makes the automated repair problem more challenging than the traditional practice of presuming that a program contains a single fault. This paper studies the repair problem of multi-fault programs and identifies the main obstacles that arise when handling such programs using current repair approaches. The paper also describes three repair approaches for multi-fault programs, namely iterative, parallel, and simultaneous. While the simultaneous repair strategy depends on using cutting-edge fault localization techniques that enable the APR approaches to locate many faults at once, the iterative and parallel repair approaches rely on adapting the existing repair techniques for single-fault programs to handle multi-fault programs. Finally, the paper discusses each approach's advantages and drawbacks as well as the conditions in which the approach can be used successfully. To our knowledge, this is the first paper to specifically study and address the repair problem of multi-fault programs.
AbstractList Modern automated program repair (APR) tools are well-tuned at repairing single fault programs (i.e., programs in which only one fault can occur at time). However, real-world software projects typically contain multiple bugs at the same time, which can interact with and mask each other in a variety of ways. The complex interaction of faults in multi-fault programs makes the automated repair problem more challenging than the traditional practice of presuming that a program contains a single fault. This paper studies the repair problem of multi-fault programs and identifies the main obstacles that arise when handling such programs using current repair approaches. The paper also describes three repair approaches for multi-fault programs, namely iterative, parallel, and simultaneous. While the simultaneous repair strategy depends on using cutting-edge fault localization techniques that enable the APR approaches to locate many faults at once, the iterative and parallel repair approaches rely on adapting the existing repair techniques for single-fault programs to handle multi-fault programs. Finally, the paper discusses each approach's advantages and drawbacks as well as the conditions in which the approach can be used successfully. To our knowledge, this is the first paper to specifically study and address the repair problem of multi-fault programs.
Author Al-Bataineh, Omar I.
Author_xml – sequence: 1
  givenname: Omar I.
  surname: Al-Bataineh
  fullname: Al-Bataineh, Omar I.
  organization: Gran Sasso Science Institute,L'Aquila,Italy
BookMark eNotjjtPwzAURg0CiVIyszDkB5DitxO2qCoPqVCEYK6u7WuIlJdid-Dfkwqmc4ZPR98lOeuHHgm5ZnTFmFR3QldMc7qaqXhpTkhWmaqUlBrGZWlOyYJrKQqmDL8gWYyNpbMqzZhekNf6kIYOEvr8HUdopnwI-cuhTU0RYEb-Ng1fE3TxPt_ZmMC1GG_zehynAdz30aH3x1Ec0aV4Rc4DtBGzfy7J58PmY_1UbHePz-t6W8B8KRWChSAEuqAtSnAKKu-CpRStQANoSo_aWtAKPBXc8sC8FxKNcxUPvASxJDd_3QYR9-PUdDD97Bk1WlFtxC9WDFI2
CODEN IEEPAD
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1145/3691620.3695287
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Computer Science
EISBN 9798400712487
EISSN 2643-1572
EndPage 2219
ExternalDocumentID 10765067
Genre orig-research
GroupedDBID 6IE
6IF
6IH
6IK
6IL
6IM
6IN
6J9
AAJGR
AAWTH
ABLEC
ACREN
ADYOE
ADZIZ
AFYQB
ALMA_UNASSIGNED_HOLDINGS
AMTXH
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
IPLJI
M43
OCL
RIE
RIL
ID FETCH-LOGICAL-a248t-31ff33ecf6be4ac5a9dcfb00eb3e7ae78de6bba65ad032b2f1dd34e7cc92f28a3
IEDL.DBID RIE
ISICitedReferencesCount 1
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=001353105400183&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
IngestDate Wed Jan 15 06:20:43 EST 2025
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-a248t-31ff33ecf6be4ac5a9dcfb00eb3e7ae78de6bba65ad032b2f1dd34e7cc92f28a3
PageCount 5
ParticipantIDs ieee_primary_10765067
PublicationCentury 2000
PublicationDate 2024-Oct.-27
PublicationDateYYYYMMDD 2024-10-27
PublicationDate_xml – month: 10
  year: 2024
  text: 2024-Oct.-27
  day: 27
PublicationDecade 2020
PublicationTitle IEEE/ACM International Conference on Automated Software Engineering : [proceedings]
PublicationTitleAbbrev ASE
PublicationYear 2024
Publisher ACM
Publisher_xml – name: ACM
SSID ssib057256116
ssj0051577
Score 2.2791429
Snippet Modern automated program repair (APR) tools are well-tuned at repairing single fault programs (i.e., programs in which only one fault can occur at time)....
SourceID ieee
SourceType Publisher
StartPage 2215
SubjectTerms Computer bugs
Iterative methods
Location awareness
Machine learning
Maintenance engineering
Software
Software engineering
Title Automated Repair of Multi-fault Programs: Obstacles, Approaches, and Prospects
URI https://ieeexplore.ieee.org/document/10765067
WOSCitedRecordID wos001353105400183&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV07T8MwELZoxcBUHkW8lYGRQON32CpExYBKB0Ddqot9lrqkqE35_ZzdFMTAwOSHIsuyc3ef7fvuGLt2hQkIweTSFTqXBlROKJyaCKK0yoNOXr7vz2Y8ttNpOWnJ6okLg4jJ-QxvYzW95fuFW8erMpJwQ4BCmw7rGKM3ZK3tz6MMGe8iYp2NGiY7bUwby6eQ6k5oAkKczqi6VNz-TqaSbMmo989Z7LP-Dysvm3zbmwO2g_Uh623TMmStlB6x8XDdLAiIos8IXsN8mS1Cloi2eQAq4iDRJ2t1n71UBA6jX9xNNmyDi8c61D5-lFiYqz57Gz2-PjzlbdqEHLi0DWnVEIRAF3SFEpyC0rtA0kXHZjSAxnrUVQVagR8IXvFQeC8kGudKHrgFccy69aLGE5aVUgarpZWCUKIb2BIqUDL4tI0y6FPWj-sz-9hExphtl-bsj_5ztscJFETdz80F6zbLNV6yXffZzFfLq7SfX4wUoXM
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV07T8MwELagIMFUHkW88cBIoPE7bBWiKqKEDgV1qxw_pC4JalN-P2c3BTEwMNmOrCiyff4-O_fdIXRtUumd9jJhJhUJk5onwMKh6TTNFLdaRC_f96HMczWZZKNGrB61MM656HzmbkM1_su3lVmGqzKwcAmEQshNtBVSZzVyrfXy4RLgOw1sZ7URA1JL2UTzSRm_owKoEIFTqsg4Ub_TqUQ06bf_-R17qPOjy8Ojb8TZRxuuPEDtdWIG3NjpIcp7y7oCKuosBoKtZ3NceRyltonXUISXBK-sxT1-LYAeBs-4G9xrwouHui5t6BR1mIsOeus_jh8GSZM4IdGEqRr2Ve8pdcaLwjFtuM6s8WBfcHB2UjuprBNFoQXXtktJQXxqLWVOGpMRT5SmR6hVVqU7RjhjzCvBFKPAE01XZbrQnHkbJ5J5cYI6YXymH6vYGNP10Jz-8fwK7QzGL8Pp8Cl_PkO7BChCQAIiz1Grni_dBdo2n_VsMb-Mc_sFJHqkvA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=IEEE%2FACM+International+Conference+on+Automated+Software+Engineering+%3A+%5Bproceedings%5D&rft.atitle=Automated+Repair+of+Multi-fault+Programs%3A+Obstacles%2C+Approaches%2C+and+Prospects&rft.au=Al-Bataineh%2C+Omar+I.&rft.date=2024-10-27&rft.pub=ACM&rft.eissn=2643-1572&rft.spage=2215&rft.epage=2219&rft_id=info:doi/10.1145%2F3691620.3695287&rft.externalDocID=10765067