RFUZZ: Coverage-Directed Fuzz Testing of RTL on FPGAs

Dynamic verification is widely used to increase confidence in the correctness of RTL circuits during the pre-silicon design phase. Despite numerous attempts over the last decades to automate the stimuli generation based on coverage feedback, Coverage Directed Test Generation (CDG) has not found the...

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Bibliographic Details

Published in:	2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) pp. 1 - 8
Main Authors:	Laeufer, Kevin, Koenig, Jack, Kim, Donggyu, Bachrach, Jonathan, Sen, Koushik
Format:	Conference Proceeding
Language:	English
Published:	ACM 01.11.2018
Subjects:	Engines Field programmable gate arrays Fuzzing Instruments Integrated circuit modeling Software
ISSN:	1558-2434
Online Access:	Get full text
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