APA (7th ed.) Citation

Liu, K., Wang, S., Kisub Kim, A. K., Bissyande, T. F., Kim, D., Wu, P., . . . Traon, Y. L. (2020, October). On the Efficiency of Test Suite based Program Repair A Systematic Assessment of 16 Automated Repair Systems for Java Programs. 2020 IEEE/ACM 42nd International Conference on Software Engineering (ICSE), 615-627. https://doi.org/10.1145/3377811.3380338

Chicago Style (17th ed.) Citation

Liu, Kui, Shangwen Wang, Anil Koyuncu Kisub Kim, Tegawende F. Bissyande, Dongsun Kim, Peng Wu, Jacques Klein, Xiaoguang Mao, and Yves Le Traon. "On the Efficiency of Test Suite Based Program Repair A Systematic Assessment of 16 Automated Repair Systems for Java Programs." 2020 IEEE/ACM 42nd International Conference on Software Engineering (ICSE) Oct. 2020: 615-627. https://doi.org/10.1145/3377811.3380338.

MLA (9th ed.) Citation

Liu, Kui, et al. "On the Efficiency of Test Suite Based Program Repair A Systematic Assessment of 16 Automated Repair Systems for Java Programs." 2020 IEEE/ACM 42nd International Conference on Software Engineering (ICSE), Oct. 2020, pp. 615-627, https://doi.org/10.1145/3377811.3380338.