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Chicago-Zitierstil (17. Ausg.)Liu, Kui, Shangwen Wang, Anil Koyuncu Kisub Kim, Tegawende F. Bissyande, Dongsun Kim, Peng Wu, Jacques Klein, Xiaoguang Mao, und Yves Le Traon. "On the Efficiency of Test Suite Based Program Repair A Systematic Assessment of 16 Automated Repair Systems for Java Programs." 2020 IEEE/ACM 42nd International Conference on Software Engineering (ICSE) Oct. 2020: 615-627. https://doi.org/10.1145/3377811.3380338.
MLA-Zitierstil (9. Ausg.)Liu, Kui, et al. "On the Efficiency of Test Suite Based Program Repair A Systematic Assessment of 16 Automated Repair Systems for Java Programs." 2020 IEEE/ACM 42nd International Conference on Software Engineering (ICSE), Oct. 2020, pp. 615-627, https://doi.org/10.1145/3377811.3380338.