Liu, K., Wang, S., Kisub Kim, A. K., Bissyande, T. F., Kim, D., Wu, P., . . . Traon, Y. L. (2020, October). On the Efficiency of Test Suite based Program Repair A Systematic Assessment of 16 Automated Repair Systems for Java Programs. 2020 IEEE/ACM 42nd International Conference on Software Engineering (ICSE), 615-627. https://doi.org/10.1145/3377811.3380338
Citace podle Chicago (17th ed.)Liu, Kui, Shangwen Wang, Anil Koyuncu Kisub Kim, Tegawende F. Bissyande, Dongsun Kim, Peng Wu, Jacques Klein, Xiaoguang Mao, a Yves Le Traon. "On the Efficiency of Test Suite Based Program Repair A Systematic Assessment of 16 Automated Repair Systems for Java Programs." 2020 IEEE/ACM 42nd International Conference on Software Engineering (ICSE) Oct. 2020: 615-627. https://doi.org/10.1145/3377811.3380338.
Citace podle MLA (9th ed.)Liu, Kui, et al. "On the Efficiency of Test Suite Based Program Repair A Systematic Assessment of 16 Automated Repair Systems for Java Programs." 2020 IEEE/ACM 42nd International Conference on Software Engineering (ICSE), Oct. 2020, pp. 615-627, https://doi.org/10.1145/3377811.3380338.