ICCAD-2012 CAD contest in fuzzy pattern matching for physical verification and benchmark suite

With the widespread adoption of design for manufacturing techniques and design and process co-optimization as well as the increase in the complexity of the processes to manufacture integrated circuits there is pressing need in finding quickly to calibrate yet accurate and high performing methods to...

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Bibliographic Details
Published in:2012 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) pp. 349 - 350
Main Author: Torres, J. Andres
Format: Conference Proceeding
Language:English
Published: New York, NY, USA ACM 05.11.2012
IEEE
Series:ACM Conferences
Subjects:
ISBN:9781450315739, 1450315739
ISSN:1092-3152
Online Access:Get full text
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