Towards a Comprehensive Test Suite for Detectors of Design Patterns
Detection of design patterns is an important part of reverse engineering. Availability of patterns provides for a better understanding of code and also makes analysis more efficient in terms of time and cost. In recent years, we have observed a continual improvement in the field of automatic detecti...
Saved in:
| Published in: | 2009 IEEE/ACM International Conference on Automated Software Engineering pp. 103 - 110 |
|---|---|
| Main Authors: | , |
| Format: | Conference Proceeding |
| Language: | English |
| Published: |
IEEE
01.11.2009
|
| Subjects: | |
| ISBN: | 1424452597, 9781424452590 |
| ISSN: | 1938-4300 |
| Online Access: | Get full text |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Abstract | Detection of design patterns is an important part of reverse engineering. Availability of patterns provides for a better understanding of code and also makes analysis more efficient in terms of time and cost. In recent years, we have observed a continual improvement in the field of automatic detection of design patterns in source code. Existing approaches can detect a fairly broad range of design patterns, targeting both structural and behavioral aspects of patterns. However, it is not straightforward to assess and compare these approaches. There is no common ground on which to evaluate the accuracy of the detection approaches, given the existence of variants and specific code constructs used to implement a design pattern. We propose a systematic approach to constructing a comprehensive test suite for detectors of design patterns. This approach is applied to construct a test suite covering the Singleton pattern. The test suite contains many implementation variants of these patterns, along with such code constructs as method forwarding, access modifiers, and long inheritance paths. Furthermore, we use this test suite to compare three detection tools and to identify their strengths and weaknesses. |
|---|---|
| AbstractList | Detection of design patterns is an important part of reverse engineering. Availability of patterns provides for a better understanding of code and also makes analysis more efficient in terms of time and cost. In recent years, we have observed a continual improvement in the field of automatic detection of design patterns in source code. Existing approaches can detect a fairly broad range of design patterns, targeting both structural and behavioral aspects of patterns. However, it is not straightforward to assess and compare these approaches. There is no common ground on which to evaluate the accuracy of the detection approaches, given the existence of variants and specific code constructs used to implement a design pattern. We propose a systematic approach to constructing a comprehensive test suite for detectors of design patterns. This approach is applied to construct a test suite covering the Singleton pattern. The test suite contains many implementation variants of these patterns, along with such code constructs as method forwarding, access modifiers, and long inheritance paths. Furthermore, we use this test suite to compare three detection tools and to identify their strengths and weaknesses. |
| Author | Stencel, K. Wegrzynowicz, P. |
| Author_xml | – sequence: 1 givenname: P. surname: Wegrzynowicz fullname: Wegrzynowicz, P. organization: Software R&D Dept., NASK Res. & Acad. Comput. Network, Warsaw, Poland – sequence: 2 givenname: K. surname: Stencel fullname: Stencel, K. organization: Inst. of Inf., Warsaw Univ., Warsaw, Poland |
| BookMark | eNotjk1LAzEYhCNWsK178uglf2DXfDbJsaytCgWFrueSzb7RFbspSVT89wZ0LsMwzPAs0GwKEyB0TUlDKTG36_2mYYSYRsszVBmliVoZybWh4hwtqGBCSCaNmqE5NVzXghNyiaqU3klR6Yymc9R24dvGIWGL23A8RXiDKY1fgDtIGe8_xwzYh4jvIIPLISYcfAlpfJ3ws80Z4pSu0IW3Hwmqf1-il-2max_q3dP9Y7ve1ZZxk2sogF46VQgH4wT00EtPlOI9CNC9o7ByBiyVejX0TDLFB68HW0beKQ-UL9HN3-8IAIdTHI82_hyk4FQpzX8BevROtg |
| ContentType | Conference Proceeding |
| DBID | 6IE 6IL CBEJK RIE RIL |
| DOI | 10.1109/ASE.2009.85 |
| DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE Electronic Library (IEL) IEEE Proceedings Order Plans (POP All) 1998-Present |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Computer Science |
| EISBN | 9780769538914 0769538916 |
| EndPage | 110 |
| ExternalDocumentID | 5431778 |
| Genre | orig-research |
| GroupedDBID | 29I 6IE 6IF 6IH 6IK 6IL 6IM 6IN 6J9 AAJGR AAWTH ABLEC ACREN ADYOE ADZIZ AFYQB ALMA_UNASSIGNED_HOLDINGS AMTXH APO BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK CHZPO IEGSK IPLJI M43 OCL RIE RIL |
| ID | FETCH-LOGICAL-a239t-e076f5c7891d9c4ebeb5f0773be4e8bc1e6c9ea1586db25273df8da76ffc7fe13 |
| IEDL.DBID | RIE |
| ISBN | 1424452597 9781424452590 |
| ISICitedReferencesCount | 0 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000278137400009&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| ISSN | 1938-4300 |
| IngestDate | Wed Aug 27 08:36:34 EDT 2025 |
| IsPeerReviewed | false |
| IsScholarly | true |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-a239t-e076f5c7891d9c4ebeb5f0773be4e8bc1e6c9ea1586db25273df8da76ffc7fe13 |
| PageCount | 8 |
| ParticipantIDs | ieee_primary_5431778 |
| PublicationCentury | 2000 |
| PublicationDate | 2009-Nov. |
| PublicationDateYYYYMMDD | 2009-11-01 |
| PublicationDate_xml | – month: 11 year: 2009 text: 2009-Nov. |
| PublicationDecade | 2000 |
| PublicationTitle | 2009 IEEE/ACM International Conference on Automated Software Engineering |
| PublicationTitleAbbrev | ASE |
| PublicationYear | 2009 |
| Publisher | IEEE |
| Publisher_xml | – name: IEEE |
| SSID | ssj0000452981 ssj0051577 ssj0001130041 |
| Score | 1.7300818 |
| Snippet | Detection of design patterns is an important part of reverse engineering. Availability of patterns provides for a better understanding of code and also makes... |
| SourceID | ieee |
| SourceType | Publisher |
| StartPage | 103 |
| SubjectTerms | Automatic testing Costs design patterns detection Detectors Documentation Pattern analysis Reverse engineering Software engineering Software systems Software testing System testing test suite |
| Title | Towards a Comprehensive Test Suite for Detectors of Design Patterns |
| URI | https://ieeexplore.ieee.org/document/5431778 |
| WOSCitedRecordID | wos000278137400009&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV09T8MwED21FQNTgRbxLQ-MhCbEie0RlVZMVaUWqVvl2GfBkqKm5fdzdpLCwMIW5xQp8tm-0_neewD3FERTVVDmZh1tcs6VifSTprWstEWLmueWB7EJMZvJ1UrNO_BwwMIgYmg-w0f_GO7y7cbsfals5HHbQsgudIUQNVbrUE_x1OCqwVCG-koSuKTaU5nCdlBhpHxFRpxMLcgro_xftNxPzThugHxJrEbPi0nNaunVln8JsIT4M-3_789PYPgD5GPzQ4g6hQ6WZ9BvlRxYs7EHMF6G7tmKaeaNW3yv-9rZkoIGW-wpL2WU3bIX3IUqf8U2jga--YPNA0NnWQ3hbTpZjl-jRl6BvJGqXYSxyF1mhFSJVYaTN4vMxUKkBXKUhUkwNwp1kkmvOeWJ2qyTVtNHzgiHSXoOvXJT4gWwXMdSkIXnheGGZ1KnJiu4oVNdYOrUJQz8nKw_awaNdTMdV3-_vobjcGcTEH830Ntt93gLR-Zr91Ft74LbvwGzMKZn |
| linkProvider | IEEE |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV09T8MwELVKQYKpQIv4xgMjoUnjxPaIoFURparUIHWrHOcsWFLUpPx-zk5SGFjY4pwsRf66y_nee4TcohMNZYqRW2ZwkzMmtacGCteyVBlkoFicMSc2wadTsVjIWYvcbbEwAOCKz-DePrq7_GylNzZV1re4bc7FDtmNGBsEFVprm1Gx5OCyRlG6DEvg2KSacxkdt9NhxIhFeAxNDcwrwj8A3rA_1W2_hvIFvuw_zIcVr6XVW_4lweI80Kjzv28_JL0fKB-dbZ3UEWlBfkw6jZYDrbd2lzwmrn62oIpa4xreq8p2mqDboPMNRqYU41v6BKXL8xd0ZbBhyz_ozHF05kWPvI2GyePYqwUWcD5CWXrg89hEmgsZZFIznM80Mj7nYQoMRKoDiLUEFUTCqk5ZqrbMiExhJ6O5gSA8Ie18lcMpobHyBUcLi1PNNIuECnWUMo3nOofQyDPStWOy_Kw4NJb1cJz__fqG7I-T18ly8jx9uSAH7gbH4f8uSbtcb-CK7Omv8qNYX7sl8A2R3Kmu |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2009+IEEE%2FACM+International+Conference+on+Automated+Software+Engineering&rft.atitle=Towards+a+Comprehensive+Test+Suite+for+Detectors+of+Design+Patterns&rft.au=Wegrzynowicz%2C+P.&rft.au=Stencel%2C+K.&rft.date=2009-11-01&rft.pub=IEEE&rft.isbn=9781424452590&rft.issn=1938-4300&rft.spage=103&rft.epage=110&rft_id=info:doi/10.1109%2FASE.2009.85&rft.externalDocID=5431778 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1938-4300&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1938-4300&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1938-4300&client=summon |

