APA-Zitierstil (7. Ausg.)

Wegrzynowicz, P., & Stencel, K. (2009, November). Towards a Comprehensive Test Suite for Detectors of Design Patterns. 2009 IEEE/ACM International Conference on Automated Software Engineering, 103-110. https://doi.org/10.1109/ASE.2009.85

Chicago-Zitierstil (17. Ausg.)

Wegrzynowicz, P., und K. Stencel. "Towards a Comprehensive Test Suite for Detectors of Design Patterns." 2009 IEEE/ACM International Conference on Automated Software Engineering Nov. 2009: 103-110. https://doi.org/10.1109/ASE.2009.85.

MLA-Zitierstil (9. Ausg.)

Wegrzynowicz, P., und K. Stencel. "Towards a Comprehensive Test Suite for Detectors of Design Patterns." 2009 IEEE/ACM International Conference on Automated Software Engineering, Nov. 2009, pp. 103-110, https://doi.org/10.1109/ASE.2009.85.