APA (7th ed.) Citation

Li, M., Davoodi, A., & Xie, L. (2012, March 12). Custom on-chip sensors for post-silicon failing path isolation in the presence of process variations. Proceedings of the Conference on Design, Automation and Test in Europe, 1591-1596. https://doi.org/10.5555/2492708.2493095

Chicago Style (17th ed.) Citation

Li, Min, Azadeh Davoodi, and Lin Xie. "Custom On-chip Sensors for Post-silicon Failing Path Isolation in the Presence of Process Variations." Proceedings of the Conference on Design, Automation and Test in Europe 12 Mar. 2012: 1591-1596. https://doi.org/10.5555/2492708.2493095.

MLA (9th ed.) Citation

Li, Min, et al. "Custom On-chip Sensors for Post-silicon Failing Path Isolation in the Presence of Process Variations." Proceedings of the Conference on Design, Automation and Test in Europe, 12 Mar. 2012, pp. 1591-1596, https://doi.org/10.5555/2492708.2493095.