Combining deterministic and genetic approaches for sequential circuit test generation

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Vydané v:Proceedings of the 32nd annual ACM/IEEE Design Automation Conference s. 183 - 188
Hlavní autori: Rudnick, Elizabeth M., Patel, Janak H.
Médium: Konferenčný príspevok..
Jazyk:English
Vydavateľské údaje: New York, NY, USA ACM 01.01.1995
Edícia:ACM Conferences
Predmet:
Hardware > Hardware test > Test-pattern generation and fault simulation
Hardware > Integrated circuits > Logic circuits > Sequential circuits
ISBN:0897917251, 9780897917254
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Author Patel, Janak H.
Rudnick, Elizabeth M.
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  organization: Motorola, Incorporated, Austin, TX
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  givenname: Janak H.
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  fullname: Patel, Janak H.
  organization: Center for Reliable & High-Performance Computing, University of Illinois, Urbana, IL
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SubjectTerms Hardware -- Hardware test -- Test-pattern generation and fault simulation
Hardware -- Integrated circuits -- Logic circuits -- Sequential circuits
Title Combining deterministic and genetic approaches for sequential circuit test generation
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