Combining deterministic and genetic approaches for sequential circuit test generation

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Bibliographic Details
Published in:Proceedings of the 32nd annual ACM/IEEE Design Automation Conference pp. 183 - 188
Main Authors: Rudnick, Elizabeth M., Patel, Janak H.
Format: Conference Proceeding
Language:English
Published: New York, NY, USA ACM 01.01.1995
Series:ACM Conferences
Subjects:
Hardware > Hardware test > Test-pattern generation and fault simulation
Hardware > Integrated circuits > Logic circuits > Sequential circuits
ISBN:0897917251, 9780897917254
Online Access:Get full text
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Bibliography:SourceType-Conference Papers & Proceedings-1
ObjectType-Conference Paper-1
content type line 25
ISBN:0897917251
9780897917254
DOI:10.1145/217474.217527