Rudnick, E. M., & Patel, J. H. (1995, January). Combining deterministic and genetic approaches for sequential circuit test generation. Proceedings of the 32nd annual ACM/IEEE Design Automation Conference, 183-188. https://doi.org/10.1145/217474.217527
Chicago-Zitierstil (17. Ausg.)Rudnick, Elizabeth M., und Janak H. Patel. "Combining Deterministic and Genetic Approaches for Sequential Circuit Test Generation." Proceedings of the 32nd Annual ACM/IEEE Design Automation Conference Jan. 1995: 183-188. https://doi.org/10.1145/217474.217527.
MLA-Zitierstil (9. Ausg.)Rudnick, Elizabeth M., und Janak H. Patel. "Combining Deterministic and Genetic Approaches for Sequential Circuit Test Generation." Proceedings of the 32nd Annual ACM/IEEE Design Automation Conference, Jan. 1995, pp. 183-188, https://doi.org/10.1145/217474.217527.