A new technique for characterization of digital-to-analog converters in high-speed systems

In this paper, a new technique for characterization of digital-to-analog converters (DAC) used in wideband applications is described. Unlike the standard narrowband approach, this technique employs Least Square Estimation to characterize the DAC from dc to any target frequency. Characterization is p...

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Bibliographic Details
Published in:2007 Design, Automation & Test in Europe Conference & Exhibition : Nice, France, 16-20 April 2007 pp. 433 - 438
Main Authors: Savoj, Jafar, Abbasfar, Ali-Azam, Amirkhany, Amir, Garlepp, Bruno W., Horowitz, Mark A.
Format: Conference Proceeding
Language:English
Published: San Jose, CA, USA EDA Consortium 16.04.2007
Series:ACM Conferences
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ISBN:3981080122, 9783981080124
Online Access:Get full text
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Summary:In this paper, a new technique for characterization of digital-to-analog converters (DAC) used in wideband applications is described. Unlike the standard narrowband approach, this technique employs Least Square Estimation to characterize the DAC from dc to any target frequency. Characterization is performed using a random sequence with certain temporal and probabilistic characteristics suitable for intended operating conditions. The technique provides a linear estimation of the system and decomposes nonlinearity into higher-order harmonics and deterministic periodic noise. The technique can also be used to derive the impulse response of the converter, predict its operating bandwidth, and provide far more insight into its sources of distortion.
Bibliography:SourceType-Conference Papers & Proceedings-1
ObjectType-Conference Paper-1
content type line 25
ISBN:3981080122
9783981080124
DOI:10.5555/1266366.1266457