Linear Model-Based Error Identification and Calibration for Data Converters

For the example of a 12-bit Nyquist-rate ADC, a model for nonlinearity-causing mechanisms is developed based on circuit simulations. The model is used to estimate circuit element values from measured device characteristics. Post-manufacture reconfiguration of the digital control part of the device-t...

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Veröffentlicht in:Design, Automation, and Test in Europe: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1; 03-07 Mar. 2003 S. 10630
Hauptverfasser: Wegener, Carsten, Kennedy, Michael Peter
Format: Tagungsbericht
Sprache:Englisch
Veröffentlicht: Washington, DC, USA IEEE Computer Society 03.03.2003
Schriftenreihe:ACM Conferences
Schlagworte:
Applied computing > Physical sciences and engineering > Electronics
Hardware > Hardware validation
Hardware > Hardware validation > Functional verification > Simulation and emulation
Hardware > Integrated circuits > Interconnect > Input > output circuits
ISBN:0769518702, 9780769518701
ISSN:1530-1591
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Zusammenfassung:For the example of a 12-bit Nyquist-rate ADC, a model for nonlinearity-causing mechanisms is developed based on circuit simulations. The model is used to estimate circuit element values from measured device characteristics. Post-manufacture reconfiguration of the digital control part of the device-type that is used as a test vehicle in this work can improve the linearity performance of a device. An algorithm is proposed that searches for a locally-optimal reconfiguration based on the determined circuit element values. Applying calibration to the circuit simulation model allows one to estimate the performance improvement obtainable with the proposed calibration scheme for a given manufacturing process prior to a physical implementation.
Bibliographie:SourceType-Conference Papers & Proceedings-1
ObjectType-Conference Paper-1
content type line 25
ISBN:0769518702
9780769518701
ISSN:1530-1591
DOI:10.5555/789083.1022796