Linear Model-Based Error Identification and Calibration for Data Converters

For the example of a 12-bit Nyquist-rate ADC, a model for nonlinearity-causing mechanisms is developed based on circuit simulations. The model is used to estimate circuit element values from measured device characteristics. Post-manufacture reconfiguration of the digital control part of the device-t...

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Vydané v:	Design, Automation, and Test in Europe: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1; 03-07 Mar. 2003 s. 10630
Hlavní autori:	Wegener, Carsten, Kennedy, Michael Peter
Médium:	Konferenčný príspevok..
Jazyk:	English
Vydavateľské údaje:	Washington, DC, USA IEEE Computer Society 03.03.2003
Edícia:	ACM Conferences
Predmet:	Applied computing > Physical sciences and engineering > Electronics Hardware > Hardware validation Hardware > Hardware validation > Functional verification > Simulation and emulation Hardware > Integrated circuits > Interconnect > Input > output circuits
ISBN:	0769518702, 9780769518701
ISSN:	1530-1591
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