Linear Model-Based Error Identification and Calibration for Data Converters

For the example of a 12-bit Nyquist-rate ADC, a model for nonlinearity-causing mechanisms is developed based on circuit simulations. The model is used to estimate circuit element values from measured device characteristics. Post-manufacture reconfiguration of the digital control part of the device-t...

Full description

Saved in:
Bibliographic Details
Published in:Design, Automation, and Test in Europe: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1; 03-07 Mar. 2003 p. 10630
Main Authors: Wegener, Carsten, Kennedy, Michael Peter
Format: Conference Proceeding
Language:English
Published: Washington, DC, USA IEEE Computer Society 03.03.2003
Series:ACM Conferences
Subjects:
Applied computing > Physical sciences and engineering > Electronics
Hardware > Hardware validation
Hardware > Hardware validation > Functional verification > Simulation and emulation
Hardware > Integrated circuits > Interconnect > Input > output circuits
ISBN:0769518702, 9780769518701
ISSN:1530-1591
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Be the first to leave a comment!
You must be logged in first