Adjustable Width Linear Combinational Scan Vector Decompression

A new scheme for combinational linear expansion isproposed for decompression of scan vectors. It has thecapability to adjust the width of the linear expansion each clockcycle. This eliminates the requirement that every scan bit-slicebe in the output space of the linear decompressor. Depending onhow...

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Veröffentlicht in:International Conference on Computer Aided Design: Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design; 09-13 Nov. 2003 S. 863
Hauptverfasser: Krishna, C. V., Touba, Nur A.
Format: Tagungsbericht
Sprache:Englisch
Veröffentlicht: Washington, DC, USA IEEE Computer Society 09.11.2003
Schriftenreihe:ACM Conferences
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ISBN:9781581137620, 1581137621
ISSN:1092-3152
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Abstract A new scheme for combinational linear expansion isproposed for decompression of scan vectors. It has thecapability to adjust the width of the linear expansion each clockcycle. This eliminates the requirement that every scan bit-slicebe in the output space of the linear decompressor. Depending onhow specified the current bit-slice is, the decompressor may loadall scan chains or may load only a subset of the scan chains.This provides the nice feature that any scan vector can begenerated using the proposed scheme regardless of the numberor distribution of the specified bits. Thus, the proposed schemeallows the use of any ATPG procedure without any constraints.Moreover, it allows greater compression to be achieved thanfixed width expansion techniques since the ratio of the number ofscan chains to the number of tester channels can be scaled muchlarger. A procedure for designing and optimizing the adjustablewidth decompression hardware and obtaining the compresseddata is described. Experimental data indicates that the proposedscheme is simple yet very effective.
AbstractList A new scheme for combinational linear expansion isproposed for decompression of scan vectors. It has thecapability to adjust the width of the linear expansion each clockcycle. This eliminates the requirement that every scan bit-slicebe in the output space of the linear decompressor. Depending onhow specified the current bit-slice is, the decompressor may loadall scan chains or may load only a subset of the scan chains.This provides the nice feature that any scan vector can begenerated using the proposed scheme regardless of the numberor distribution of the specified bits. Thus, the proposed schemeallows the use of any ATPG procedure without any constraints.Moreover, it allows greater compression to be achieved thanfixed width expansion techniques since the ratio of the number ofscan chains to the number of tester channels can be scaled muchlarger. A procedure for designing and optimizing the adjustablewidth decompression hardware and obtaining the compresseddata is described. Experimental data indicates that the proposedscheme is simple yet very effective.
Author Krishna, C. V.
Touba, Nur A.
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  fullname: Touba, Nur A.
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Snippet A new scheme for combinational linear expansion isproposed for decompression of scan vectors. It has thecapability to adjust the width of the linear expansion...
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SubjectTerms Information systems -- Data management systems -- Data structures -- Data layout -- Data compression
Mathematics of computing -- Discrete mathematics -- Combinatorics -- Combinatorial algorithms
Mathematics of computing -- Mathematical analysis -- Numerical analysis -- Computations on polynomials
Title Adjustable Width Linear Combinational Scan Vector Decompression
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