APA (7th ed.) Citation

Pomeranz, I., & Reddy, S. M. (2003, March 3). A New Approach to Test Generation and Test Compaction for Scan Circuits. Design, Automation, and Test in Europe: Proceedings of the conference on Design, Automation and Test in Europe - Volume 1; 03-07 Mar. 2003, 11000. https://doi.org/10.5555/789083.1022853

Chicago Style (17th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "A New Approach to Test Generation and Test Compaction for Scan Circuits." Design, Automation, and Test in Europe: Proceedings of the Conference on Design, Automation and Test in Europe - Volume 1; 03-07 Mar. 2003 3 Mar. 2003: 11000. https://doi.org/10.5555/789083.1022853.

MLA (9th ed.) Citation

Pomeranz, Irith, and Sudhakar M. Reddy. "A New Approach to Test Generation and Test Compaction for Scan Circuits." Design, Automation, and Test in Europe: Proceedings of the Conference on Design, Automation and Test in Europe - Volume 1; 03-07 Mar. 2003, 3 Mar. 2003, p. 11000, https://doi.org/10.5555/789083.1022853.