Wang, M., Wang, H., Mu, J., Zhang, X., Sun, B., Wen, Y., . . . Li, H. (2025, June 22). EPICS: Efficient Parallel Pattern Fault Simulation for Sequential Circuits via Strongly Connected Components. 2025 62nd ACM/IEEE Design Automation Conference (DAC), 1-7. https://doi.org/10.1109/DAC63849.2025.11132928
Citace podle Chicago (17th ed.)Wang, Mingjun, et al. "EPICS: Efficient Parallel Pattern Fault Simulation for Sequential Circuits via Strongly Connected Components." 2025 62nd ACM/IEEE Design Automation Conference (DAC) 22 Jun. 2025: 1-7. https://doi.org/10.1109/DAC63849.2025.11132928.
Citace podle MLA (9th ed.)Wang, Mingjun, et al. "EPICS: Efficient Parallel Pattern Fault Simulation for Sequential Circuits via Strongly Connected Components." 2025 62nd ACM/IEEE Design Automation Conference (DAC), 22 Jun. 2025, pp. 1-7, https://doi.org/10.1109/DAC63849.2025.11132928.