Gu, Y., Liu, Y., Wu, X., Shao, B., Wu, C., Li, S., . . . Lin, F. (2025, June 22). MemSeer: Leverage Memory Failure Distinctions and Multi-Grained Prediction in Ultra-Scale Heterogeneous X86/ARM Clusters. 2025 62nd ACM/IEEE Design Automation Conference (DAC), 1-7. https://doi.org/10.1109/DAC63849.2025.11132417
Citace podle Chicago (17th ed.)Gu, Yunfei, et al. "MemSeer: Leverage Memory Failure Distinctions and Multi-Grained Prediction in Ultra-Scale Heterogeneous X86/ARM Clusters." 2025 62nd ACM/IEEE Design Automation Conference (DAC) 22 Jun. 2025: 1-7. https://doi.org/10.1109/DAC63849.2025.11132417.
Citace podle MLA (9th ed.)Gu, Yunfei, et al. "MemSeer: Leverage Memory Failure Distinctions and Multi-Grained Prediction in Ultra-Scale Heterogeneous X86/ARM Clusters." 2025 62nd ACM/IEEE Design Automation Conference (DAC), 22 Jun. 2025, pp. 1-7, https://doi.org/10.1109/DAC63849.2025.11132417.